{"title":"提高故障字典提供的诊断的准确性","authors":"J. Sheppard, W. Simpson","doi":"10.1109/VTEST.1996.510855","DOIUrl":null,"url":null,"abstract":"Using nearest neighbor classification with fault dictionaries to resolve inexact signature matches in digital circuit diagnosis is inadequate. Nearest neighbor focuses on the possible diagnoses rather than on the tests. Our alternative-the information flow model-focuses on test information in the fault dictionary to provide more accurate diagnostics.","PeriodicalId":424579,"journal":{"name":"Proceedings of 14th VLSI Test Symposium","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-04-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"24","resultStr":"{\"title\":\"Improving the accuracy of diagnostics provided by fault dictionaries\",\"authors\":\"J. Sheppard, W. Simpson\",\"doi\":\"10.1109/VTEST.1996.510855\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Using nearest neighbor classification with fault dictionaries to resolve inexact signature matches in digital circuit diagnosis is inadequate. Nearest neighbor focuses on the possible diagnoses rather than on the tests. Our alternative-the information flow model-focuses on test information in the fault dictionary to provide more accurate diagnostics.\",\"PeriodicalId\":424579,\"journal\":{\"name\":\"Proceedings of 14th VLSI Test Symposium\",\"volume\":\"17 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-04-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"24\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 14th VLSI Test Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VTEST.1996.510855\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 14th VLSI Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.1996.510855","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Improving the accuracy of diagnostics provided by fault dictionaries
Using nearest neighbor classification with fault dictionaries to resolve inexact signature matches in digital circuit diagnosis is inadequate. Nearest neighbor focuses on the possible diagnoses rather than on the tests. Our alternative-the information flow model-focuses on test information in the fault dictionary to provide more accurate diagnostics.