多层嵌入式电容器用树脂包覆铜电容(RC3)纳米复合材料

R. Das, S. Rosser, K. Papathomas, M. Poliks, J. Lauffer, V. Markovich
{"title":"多层嵌入式电容器用树脂包覆铜电容(RC3)纳米复合材料","authors":"R. Das, S. Rosser, K. Papathomas, M. Poliks, J. Lauffer, V. Markovich","doi":"10.1109/ECTC.2008.4550054","DOIUrl":null,"url":null,"abstract":"This paper discusses thin film technology based on resin coated copper capacitive (RC3) nanocomposites. In particular, we highlight recent developments on high capacitance, large area, thin film passives, their integration in printed wiring boards (PWB), system in package (SiP) and chip package substrates and the reliability of the embedded capacitors. A variety of RC3 nanocomposite thin films ranging from 2 microns to 50 microns thick were processed on PWB substrates by liquid coating or printing processes. SEM micrographs showed uniform particle distribution in the coatings. The electrical performance of composites was characterized by dielectric constant (Dk), capacitance and dissipation factor (loss) measurements. Nanocomposites resulted in high capacitance density (7-500 nF/inch2) at 1 MHz. The manufacturability of these films and their reliability has been tested using large area (13 inch times 18 inch or 19.5 inch times24 inch) test vehicles. Reliability of the RC3 nanocomposite was ascertained by IR-reflow, PCT (pressure cooker test) and solder shock. As a case study, an example of RC3 based multilayer embedded capacitor construction for a flip-chip plastic ball grid array package with a 300 mum core via pitch is given. This effort is an integrated approach centering on three interrelated fronts: (1) materials development and characterization; (2) fabrication, and (3) integration at the device level.","PeriodicalId":378788,"journal":{"name":"2008 58th Electronic Components and Technology Conference","volume":"39 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-05-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Resin coated copper capacitive (RC3) nanocomposites for multilayer embedded capacitors\",\"authors\":\"R. Das, S. Rosser, K. Papathomas, M. Poliks, J. Lauffer, V. Markovich\",\"doi\":\"10.1109/ECTC.2008.4550054\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper discusses thin film technology based on resin coated copper capacitive (RC3) nanocomposites. In particular, we highlight recent developments on high capacitance, large area, thin film passives, their integration in printed wiring boards (PWB), system in package (SiP) and chip package substrates and the reliability of the embedded capacitors. A variety of RC3 nanocomposite thin films ranging from 2 microns to 50 microns thick were processed on PWB substrates by liquid coating or printing processes. SEM micrographs showed uniform particle distribution in the coatings. The electrical performance of composites was characterized by dielectric constant (Dk), capacitance and dissipation factor (loss) measurements. Nanocomposites resulted in high capacitance density (7-500 nF/inch2) at 1 MHz. The manufacturability of these films and their reliability has been tested using large area (13 inch times 18 inch or 19.5 inch times24 inch) test vehicles. Reliability of the RC3 nanocomposite was ascertained by IR-reflow, PCT (pressure cooker test) and solder shock. As a case study, an example of RC3 based multilayer embedded capacitor construction for a flip-chip plastic ball grid array package with a 300 mum core via pitch is given. This effort is an integrated approach centering on three interrelated fronts: (1) materials development and characterization; (2) fabrication, and (3) integration at the device level.\",\"PeriodicalId\":378788,\"journal\":{\"name\":\"2008 58th Electronic Components and Technology Conference\",\"volume\":\"39 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-05-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 58th Electronic Components and Technology Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECTC.2008.4550054\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 58th Electronic Components and Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.2008.4550054","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

摘要

本文讨论了树脂包覆铜电容(RC3)纳米复合材料的薄膜技术。我们特别强调了高电容,大面积,薄膜无源的最新发展,它们在印刷线路板(PWB),封装系统(SiP)和芯片封装基板中的集成以及嵌入式电容器的可靠性。采用液体涂布或印刷工艺,在PWB衬底上制备了厚度为2微米至50微米的多种RC3纳米复合薄膜。SEM显微图显示涂层中颗粒分布均匀。通过介电常数(Dk)、电容和耗散因子(损耗)测量表征了复合材料的电性能。纳米复合材料在1 MHz时产生高电容密度(7-500 nF/inch2)。这些薄膜的可制造性及其可靠性已经使用大面积(13英寸乘以18英寸或19.5英寸乘以24英寸)测试车辆进行了测试。通过ir -回流、PCT(压力锅试验)和焊料冲击等试验确定了复合材料的可靠性。作为案例研究,给出了一个基于RC3的多层嵌入式电容器结构的实例,该结构用于具有300毫安螺距的倒装芯片塑料球栅阵列封装。这一努力是一种以三个相互关联的方面为中心的综合方法:(1)材料开发和表征;(2)制造,(3)器件级集成。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Resin coated copper capacitive (RC3) nanocomposites for multilayer embedded capacitors
This paper discusses thin film technology based on resin coated copper capacitive (RC3) nanocomposites. In particular, we highlight recent developments on high capacitance, large area, thin film passives, their integration in printed wiring boards (PWB), system in package (SiP) and chip package substrates and the reliability of the embedded capacitors. A variety of RC3 nanocomposite thin films ranging from 2 microns to 50 microns thick were processed on PWB substrates by liquid coating or printing processes. SEM micrographs showed uniform particle distribution in the coatings. The electrical performance of composites was characterized by dielectric constant (Dk), capacitance and dissipation factor (loss) measurements. Nanocomposites resulted in high capacitance density (7-500 nF/inch2) at 1 MHz. The manufacturability of these films and their reliability has been tested using large area (13 inch times 18 inch or 19.5 inch times24 inch) test vehicles. Reliability of the RC3 nanocomposite was ascertained by IR-reflow, PCT (pressure cooker test) and solder shock. As a case study, an example of RC3 based multilayer embedded capacitor construction for a flip-chip plastic ball grid array package with a 300 mum core via pitch is given. This effort is an integrated approach centering on three interrelated fronts: (1) materials development and characterization; (2) fabrication, and (3) integration at the device level.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信