吸湿性和温度对模贴膜(DAF)与硅模粘合强度的影响

Chunhua Guan, Martin Li, Kewei Chen, Haibin Chen, Jingshen Wu
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引用次数: 4

摘要

目前,模贴膜(DAF)已被广泛用作薄型模贴封装的粘接介质,并有取代普通模贴胶的趋势。封装小型化和模具厚度减小是电子封装行业实施DAF的主要驱动力,特别是在要求模具厚度小于100微米的应用中。然而,这种新材料的应用在行业中仍然存在一些潜在的可靠性问题,特别是封装裂纹问题,这直接关系到DAF的材料性能,如界面粘接强度和吸水率。在本研究中,采用模具剪切试验来确定DAF与硅模具之间的界面粘附强度。将带有DAF和模具的样品粘附在负载为100±5g的铜引线架上,加热至100℃,175℃保温5小时。通过这种制样方法,在模具剪切试验中发现DAF/模具界面处发生了破坏,从而可以很好地表征DAF与模具之间的粘附强度。首先进行了不同剪切速度下的试验,找出了试验的最佳条件。研究了吸湿率和试验温度对DAF与模具粘接强度的影响。结果表明:在85℃/85 rh条件下浸泡168 h后,DAF与硅模之间的抗剪强度由110N下降到21N;当测试温度为250℃时,剪切应力仅为25℃时的8%。为了了解这些吸湿和温度效应,对DAF的材料性能进行了表征,包括热膨胀系数、玻璃化转变温度、动态力学性能和吸水率。综上所述,本研究证明了吸湿性和温度对DAF与硅模之间粘附强度的影响,为DAF在不同封装中的应用提供了有用和实用的工业指导。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Effects of moisture absorption and temperature on the adhesion strength between Die Attach Film (DAF) and silicon die
Nowadays, Die Attach Film (DAF) has been commonly employed as a bonding media for thin die attach package and it has the tendency of replacing the normal die attach glues. Package miniaturization and die thickness reduction are the main drivers for DAF implementation in electronic packaging industry, especially in applications which require that the die thickness should be less than 100µm. However, there are still some potential reliability problems in the industry over the application of this new material, particularly the package crack issue which is directly related to material properties of DAF, such as the interfacial adhesion strength and the water absorption rate. In this study, die shear test is employed to determine the interfacial adhesion strength between DAF and silicon die. The samples with DAF and die were adhered on a copper leadframe with a load of 100±5g, heated to 100°C then held at 175°C for 5 hours. With this sample preparation method, the failure was found to occur at the DAF/Die interface during the die shear test, so that the adhesion strength between DAF and die can be well characterized. Measurements with different shear speeds were firstly conducted to find out the best conditions for this test. The effects of the moisture absorption and test temperature on the adhesion strength between DAF and Die were thereby studied. The results show that after being soaked at 85°C/85RH for 168 hours, the shear strength between the DAF and silicon die decrease from 110N to 21N. When the test temperature is 250°C, the shear stress is only 8% of that determined at 25°C. To understand these moisture absorption and temperature effects, the material properties of the DAF, including coefficient of thermal expansion, glass transition temperature, dynamic mechanical property, water absorption rate, were characterized. In summary, this study demonstrates the effect of moisture absorption and temperature on the adhesion strength between DAF and silicon die, which would provide useful and practical guidelines for industry for applications of DAF in different packages.
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