{"title":"大功率led在户外应用中的降解物理研究进展","authors":"Cher MingTan, Preetpal Singh","doi":"10.1109/IPFA.2016.7564322","DOIUrl":null,"url":null,"abstract":"High power LEDs are replacing the traditional lighting sources due its wide range of advantages. However, their reliability remain a concern due to the lack of understanding in terms of their failure mechanisms and related reliability studies, especially in outdoor applications. In this work, a comprehensive review on the study of humidity and high temperature based degradation mechanisms for high power LEDs is reported. The failure mechanism is found to vary at various humidity levels as well as during their life cycles. This renders the existing lifetime prediction models inapplicable for high power LEDs.","PeriodicalId":206237,"journal":{"name":"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)","volume":"37 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-07-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A review on degradation physics of high power LEDs in outdoor applications\",\"authors\":\"Cher MingTan, Preetpal Singh\",\"doi\":\"10.1109/IPFA.2016.7564322\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"High power LEDs are replacing the traditional lighting sources due its wide range of advantages. However, their reliability remain a concern due to the lack of understanding in terms of their failure mechanisms and related reliability studies, especially in outdoor applications. In this work, a comprehensive review on the study of humidity and high temperature based degradation mechanisms for high power LEDs is reported. The failure mechanism is found to vary at various humidity levels as well as during their life cycles. This renders the existing lifetime prediction models inapplicable for high power LEDs.\",\"PeriodicalId\":206237,\"journal\":{\"name\":\"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)\",\"volume\":\"37 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-07-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IPFA.2016.7564322\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPFA.2016.7564322","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A review on degradation physics of high power LEDs in outdoor applications
High power LEDs are replacing the traditional lighting sources due its wide range of advantages. However, their reliability remain a concern due to the lack of understanding in terms of their failure mechanisms and related reliability studies, especially in outdoor applications. In this work, a comprehensive review on the study of humidity and high temperature based degradation mechanisms for high power LEDs is reported. The failure mechanism is found to vary at various humidity levels as well as during their life cycles. This renders the existing lifetime prediction models inapplicable for high power LEDs.