EDT环境下低速捕获功率测试

2010 IEEE International Test Conference Pub Date : 2010-11-01 DOI:10.1109/TEST.2010.5699275

Elham K. Moghaddam, J. Rajski, S. Reddy, X. Lin, N. Mukherjee, M. Kassab

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引用次数: 14

摘要

提出了一种结合嵌入式确定性测试环境的低捕获功率测试方案。本文的关键贡献在于生成了捕获模式下从切换活动角度模拟功能操作的测试向量。工业电路的实验结果证明了该方法的有效性。

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Low capture power at-speed test in EDT environment

This paper presents a novel low capture power test scheme integrated with EDT (Embedded Deterministic Test) environment. The key contribution of this paper is to generate test vectors that in capture mode mimic functional operation from switching activity point of view. Experimental results presented for industrial circuits demonstrate the effectiveness of the proposed method.

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2010 IEEE International Test Conference

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