“Happa”系统的故障实验及备份RAM技术的提出

K. Iwasaki, H. Yoshikawa, A. Furuta
{"title":"“Happa”系统的故障实验及备份RAM技术的提出","authors":"K. Iwasaki, H. Yoshikawa, A. Furuta","doi":"10.1109/ATS.1994.367208","DOIUrl":null,"url":null,"abstract":"On the \"Happa\" parallel microcomputer system, faults were experimentally examined for the boundary of its operating range. Global bus faults, torus communication faults, and others were observed. A backup RAM technique is proposed for bus faults.<<ETX>>","PeriodicalId":182440,"journal":{"name":"Proceedings of IEEE 3rd Asian Test Symposium (ATS)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-11-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Experiments of faults on the \\\"Happa\\\" system and a proposal of backup RAM technique\",\"authors\":\"K. Iwasaki, H. Yoshikawa, A. Furuta\",\"doi\":\"10.1109/ATS.1994.367208\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"On the \\\"Happa\\\" parallel microcomputer system, faults were experimentally examined for the boundary of its operating range. Global bus faults, torus communication faults, and others were observed. A backup RAM technique is proposed for bus faults.<<ETX>>\",\"PeriodicalId\":182440,\"journal\":{\"name\":\"Proceedings of IEEE 3rd Asian Test Symposium (ATS)\",\"volume\":\"12 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-11-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of IEEE 3rd Asian Test Symposium (ATS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.1994.367208\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE 3rd Asian Test Symposium (ATS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1994.367208","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

在“Happa”并行微机系统上,对其工作范围边界进行了故障实验检测。观察到全局总线故障、环面通信故障和其他故障。针对总线故障,提出了一种备用RAM技术。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Experiments of faults on the "Happa" system and a proposal of backup RAM technique
On the "Happa" parallel microcomputer system, faults were experimentally examined for the boundary of its operating range. Global bus faults, torus communication faults, and others were observed. A backup RAM technique is proposed for bus faults.<>
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