{"title":"“Happa”系统的故障实验及备份RAM技术的提出","authors":"K. Iwasaki, H. Yoshikawa, A. Furuta","doi":"10.1109/ATS.1994.367208","DOIUrl":null,"url":null,"abstract":"On the \"Happa\" parallel microcomputer system, faults were experimentally examined for the boundary of its operating range. Global bus faults, torus communication faults, and others were observed. A backup RAM technique is proposed for bus faults.<<ETX>>","PeriodicalId":182440,"journal":{"name":"Proceedings of IEEE 3rd Asian Test Symposium (ATS)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-11-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Experiments of faults on the \\\"Happa\\\" system and a proposal of backup RAM technique\",\"authors\":\"K. Iwasaki, H. Yoshikawa, A. Furuta\",\"doi\":\"10.1109/ATS.1994.367208\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"On the \\\"Happa\\\" parallel microcomputer system, faults were experimentally examined for the boundary of its operating range. Global bus faults, torus communication faults, and others were observed. A backup RAM technique is proposed for bus faults.<<ETX>>\",\"PeriodicalId\":182440,\"journal\":{\"name\":\"Proceedings of IEEE 3rd Asian Test Symposium (ATS)\",\"volume\":\"12 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-11-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of IEEE 3rd Asian Test Symposium (ATS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.1994.367208\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE 3rd Asian Test Symposium (ATS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1994.367208","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Experiments of faults on the "Happa" system and a proposal of backup RAM technique
On the "Happa" parallel microcomputer system, faults were experimentally examined for the boundary of its operating range. Global bus faults, torus communication faults, and others were observed. A backup RAM technique is proposed for bus faults.<>