倾斜负载转换测试覆盖的布局感知扫描链重排

2006 15th Asian Test Symposium Pub Date : 2006-11-20 DOI:10.1109/ATS.2006.57

Sying-Jyan Wang, K. Peng, Katherine Shu-Min Li

{"title":"倾斜负载转换测试覆盖的布局感知扫描链重排","authors":"Sying-Jyan Wang, K. Peng, Katherine Shu-Min Li","doi":"10.1109/ATS.2006.57","DOIUrl":null,"url":null,"abstract":"In this paper, we propose a layout-based scan chain ordering method to improve fault coverage for skewed-load delay test with minimum routing overhead. This approach provides many advantages over previous methods. (1) The proposed method can provide 100% test pair coverage for all detectable transition faults. (2) With layout information taken into account, the routing penalty is small, and thus the impact on circuit performance is not significant","PeriodicalId":242530,"journal":{"name":"2006 15th Asian Test Symposium","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Layout-Aware Scan Chain Reorder for Skewed-Load Transition Test Coverage\",\"authors\":\"Sying-Jyan Wang, K. Peng, Katherine Shu-Min Li\",\"doi\":\"10.1109/ATS.2006.57\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we propose a layout-based scan chain ordering method to improve fault coverage for skewed-load delay test with minimum routing overhead. This approach provides many advantages over previous methods. (1) The proposed method can provide 100% test pair coverage for all detectable transition faults. (2) With layout information taken into account, the routing penalty is small, and thus the impact on circuit performance is not significant\",\"PeriodicalId\":242530,\"journal\":{\"name\":\"2006 15th Asian Test Symposium\",\"volume\":\"20 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-11-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 15th Asian Test Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.2006.57\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 15th Asian Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2006.57","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 5

摘要

本文提出了一种基于布局的扫描链排序方法，以最小的路由开销提高偏负载延迟测试的故障覆盖率。这种方法比以前的方法有很多优点。(1)该方法对所有可检测的过渡故障都能提供100%的测试对覆盖率。(2)考虑布局信息后，路由惩罚较小，因此对电路性能的影响不大

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Layout-Aware Scan Chain Reorder for Skewed-Load Transition Test Coverage

In this paper, we propose a layout-based scan chain ordering method to improve fault coverage for skewed-load delay test with minimum routing overhead. This approach provides many advantages over previous methods. (1) The proposed method can provide 100% test pair coverage for all detectable transition faults. (2) With layout information taken into account, the routing penalty is small, and thus the impact on circuit performance is not significant

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2006 15th Asian Test Symposium

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