{"title":"一种在标准CMOS工艺中使用横向双极光电晶体管的指纹光探测器","authors":"R. W. Sandage, J. Connelly","doi":"10.1109/IEDM.1995.497207","DOIUrl":null,"url":null,"abstract":"An integrated photodetector array has been fabricated using lateral bipolar phototransistors. These transistors are ten times as responsive (/spl lambda/=660 nm) as identically sized vertical bipolar phototransistors and arrays of this transistor consume less power than charge-coupled device arrays of the same size. The image processing for this array is accomplished through the use of a current mode comparator.","PeriodicalId":137564,"journal":{"name":"Proceedings of International Electron Devices Meeting","volume":"112 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"33","resultStr":"{\"title\":\"A fingerprint opto-detector using lateral bipolar phototransistors in a standard CMOS process\",\"authors\":\"R. W. Sandage, J. Connelly\",\"doi\":\"10.1109/IEDM.1995.497207\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An integrated photodetector array has been fabricated using lateral bipolar phototransistors. These transistors are ten times as responsive (/spl lambda/=660 nm) as identically sized vertical bipolar phototransistors and arrays of this transistor consume less power than charge-coupled device arrays of the same size. The image processing for this array is accomplished through the use of a current mode comparator.\",\"PeriodicalId\":137564,\"journal\":{\"name\":\"Proceedings of International Electron Devices Meeting\",\"volume\":\"112 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-12-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"33\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of International Electron Devices Meeting\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEDM.1995.497207\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of International Electron Devices Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.1995.497207","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A fingerprint opto-detector using lateral bipolar phototransistors in a standard CMOS process
An integrated photodetector array has been fabricated using lateral bipolar phototransistors. These transistors are ten times as responsive (/spl lambda/=660 nm) as identically sized vertical bipolar phototransistors and arrays of this transistor consume less power than charge-coupled device arrays of the same size. The image processing for this array is accomplished through the use of a current mode comparator.