静电致动器微间隙微放电成像

T. Ono, D. Sim, M. Esashi
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引用次数: 18

摘要

即使电场强度低于击穿阈值,高灵敏度CCD摄像机也能对静电致动器微腔内弱光发射引起的气体电离过程进行成像。对电离过程的观察提供了气体中空间电荷分布的信息。发现电场的不规则不稳定性和不均匀分布会导致微放电。微放电使电极材料蒸发,导致间隙内压力增大,最终导致击穿。这种效果似乎是显著的,尤其是在狭窄的缝隙中。此外,电击穿脱粒取决于电极材料。与硅-金属间隙相比,硅-硅间隙结构显示出更高的击穿阈值和预击穿阈值。说明/spl γ //sub i/效应在这一过程中起着重要作用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Imaging of micro-discharge in a micro-gap of electrostatic actuator
Weak light emission caused an ionization process of gases in the micro gag of an electrostatic actuator under a high electric field can be imaged using a high sensitive CCD camera, even if the electric field strength is below the breakdown threshold. The observation of the ionization process give an information about a space charge distribution in gases. It is found that irregular instability and the inhomogeneous distribution of electric field develop micro-discharges. The micro-discharge evaporates an electrode material, results in increasing the pressure in the gap, finally grows up to the breakdown. This effect is seemed to be remarkable, especially in narrow gaps. Furthermore, the electric breakdown threshed depends on the electrode material. Silicon-to-silicon gap configuration shows a higher breakdown threshold as well as the prebreakdown threshold in comparison with silicon-to-metal gap. It suggests that /spl gamma//sub i/ effect plays an important role in this process.
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