{"title":"线边缘粗糙度对散射法测量的线宽的系统影响","authors":"T. Siefke, S. Heidenreich","doi":"10.1117/12.2675801","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":129649,"journal":{"name":"Modeling Aspects in Optical Metrology IX","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-08-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Systematic influence of line edge roughness on the line width measured by scatterometry\",\"authors\":\"T. Siefke, S. Heidenreich\",\"doi\":\"10.1117/12.2675801\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":129649,\"journal\":{\"name\":\"Modeling Aspects in Optical Metrology IX\",\"volume\":\"6 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-08-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Modeling Aspects in Optical Metrology IX\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/12.2675801\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Modeling Aspects in Optical Metrology IX","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2675801","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}