{"title":"有源电路时域变异性分析的随机配置技术","authors":"K. Guo, F. Ferranti, B. Nouri, M. Nakhla","doi":"10.1109/EPEPS.2016.7835415","DOIUrl":null,"url":null,"abstract":"A novel method is presented for time-domain statistical analysis of large active circuits with multiple stochastic parameters. It is based on a stability-preserving model order reduction algorithm coupled with stochastic collocation schemes. Pertinent numerical results validate the proposed method.","PeriodicalId":241629,"journal":{"name":"2016 IEEE 25th Conference on Electrical Performance Of Electronic Packaging And Systems (EPEPS)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"A stochastic collocation technique for time-domain variability analysis of active circuits\",\"authors\":\"K. Guo, F. Ferranti, B. Nouri, M. Nakhla\",\"doi\":\"10.1109/EPEPS.2016.7835415\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A novel method is presented for time-domain statistical analysis of large active circuits with multiple stochastic parameters. It is based on a stability-preserving model order reduction algorithm coupled with stochastic collocation schemes. Pertinent numerical results validate the proposed method.\",\"PeriodicalId\":241629,\"journal\":{\"name\":\"2016 IEEE 25th Conference on Electrical Performance Of Electronic Packaging And Systems (EPEPS)\",\"volume\":\"22 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE 25th Conference on Electrical Performance Of Electronic Packaging And Systems (EPEPS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEPS.2016.7835415\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 25th Conference on Electrical Performance Of Electronic Packaging And Systems (EPEPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEPS.2016.7835415","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A stochastic collocation technique for time-domain variability analysis of active circuits
A novel method is presented for time-domain statistical analysis of large active circuits with multiple stochastic parameters. It is based on a stability-preserving model order reduction algorithm coupled with stochastic collocation schemes. Pertinent numerical results validate the proposed method.