大尺寸嵌入式硅扇出(eSiFO)封装工艺开发

X. Gu, Shuying Ma, Jiao Wang, Y. Hao
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引用次数: 4

摘要

随着物联网、5G、AI&VR、汽车电子等新技术的发展,对高密度、多芯片集成封装技术的迫切需求日益强烈。扇出技术作为一种新兴的先进技术,得到了广泛的关注和发展。未来几年,扇形包装的市场规模预计将增长到38亿美元,复合年增长率为19%。在本文中,成功地制造了一个尺寸为20×20 mm并包含14×14mm大嵌入式模具的封装。开发了型腔刻蚀、贴片、真空层压等关键工艺。设计了70、80、90 um三种不同厚度的电测结构组成的测试车,分别实现了不同的封装厚度。在测试车辆中,建立菊花链和其他测试单元来测量电气性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Process development of Large Size Embedded Silicon Fan-out (eSiFO) Package
With the development of new technologies such as IoT, 5G, AI&VR, automotive electronics, the urgent demand of high density, multichip integration packaging technology is increasing strongly. Fan-out technology has attracted much more attentions as a new advanced technology and grown explosively. The market scale of fan-out packaging is expected to grow to 3.8 billion US dollars with a CAGR of 19% in the next few years. In this paper, one package in a size of 20×20 mm and containing a 14×14mm large embedded die was successfully manufactured. Various key process such as cavity etching, die attach, vacuum lamination were developed. A test vehicle composed of several electrical measurement structures was designed with three different thicknesses: 70 um, 80 um and 90 um, which respectively realize different package thickness. In the test vehicles, daisy chains and other test units were established to measure electricity performance.
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