{"title":"大尺寸嵌入式硅扇出(eSiFO)封装工艺开发","authors":"X. Gu, Shuying Ma, Jiao Wang, Y. Hao","doi":"10.1109/ICEPT50128.2020.9202937","DOIUrl":null,"url":null,"abstract":"With the development of new technologies such as IoT, 5G, AI&VR, automotive electronics, the urgent demand of high density, multichip integration packaging technology is increasing strongly. Fan-out technology has attracted much more attentions as a new advanced technology and grown explosively. The market scale of fan-out packaging is expected to grow to 3.8 billion US dollars with a CAGR of 19% in the next few years. In this paper, one package in a size of 20×20 mm and containing a 14×14mm large embedded die was successfully manufactured. Various key process such as cavity etching, die attach, vacuum lamination were developed. A test vehicle composed of several electrical measurement structures was designed with three different thicknesses: 70 um, 80 um and 90 um, which respectively realize different package thickness. In the test vehicles, daisy chains and other test units were established to measure electricity performance.","PeriodicalId":136777,"journal":{"name":"2020 21st International Conference on Electronic Packaging Technology (ICEPT)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Process development of Large Size Embedded Silicon Fan-out (eSiFO) Package\",\"authors\":\"X. Gu, Shuying Ma, Jiao Wang, Y. Hao\",\"doi\":\"10.1109/ICEPT50128.2020.9202937\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"With the development of new technologies such as IoT, 5G, AI&VR, automotive electronics, the urgent demand of high density, multichip integration packaging technology is increasing strongly. Fan-out technology has attracted much more attentions as a new advanced technology and grown explosively. The market scale of fan-out packaging is expected to grow to 3.8 billion US dollars with a CAGR of 19% in the next few years. In this paper, one package in a size of 20×20 mm and containing a 14×14mm large embedded die was successfully manufactured. Various key process such as cavity etching, die attach, vacuum lamination were developed. A test vehicle composed of several electrical measurement structures was designed with three different thicknesses: 70 um, 80 um and 90 um, which respectively realize different package thickness. In the test vehicles, daisy chains and other test units were established to measure electricity performance.\",\"PeriodicalId\":136777,\"journal\":{\"name\":\"2020 21st International Conference on Electronic Packaging Technology (ICEPT)\",\"volume\":\"15 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 21st International Conference on Electronic Packaging Technology (ICEPT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICEPT50128.2020.9202937\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 21st International Conference on Electronic Packaging Technology (ICEPT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEPT50128.2020.9202937","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Process development of Large Size Embedded Silicon Fan-out (eSiFO) Package
With the development of new technologies such as IoT, 5G, AI&VR, automotive electronics, the urgent demand of high density, multichip integration packaging technology is increasing strongly. Fan-out technology has attracted much more attentions as a new advanced technology and grown explosively. The market scale of fan-out packaging is expected to grow to 3.8 billion US dollars with a CAGR of 19% in the next few years. In this paper, one package in a size of 20×20 mm and containing a 14×14mm large embedded die was successfully manufactured. Various key process such as cavity etching, die attach, vacuum lamination were developed. A test vehicle composed of several electrical measurement structures was designed with three different thicknesses: 70 um, 80 um and 90 um, which respectively realize different package thickness. In the test vehicles, daisy chains and other test units were established to measure electricity performance.