基于扫描的BIST故障诊断

Proceedings International Test Conference 1997 Pub Date : 1997-11-01 DOI:10.1109/TEST.1997.639704

J. Rajski, J. Tyszer

{"title":"基于扫描的BIST故障诊断","authors":"J. Rajski, J. Tyszer","doi":"10.1109/TEST.1997.639704","DOIUrl":null,"url":null,"abstract":"The paper presents a new fault diagnosis technique for scan-based BIST designs. It can be used for non-adaptive identification of the scan cells that are driven by erroneous signals, irrespective of the error multiplicity. The proposed scheme employs a simple scan cell selection hardware which in conjunction with a conventional signature analysis allows flexible tradeoffs between the test application time and the diagnostic resolution.","PeriodicalId":186340,"journal":{"name":"Proceedings International Test Conference 1997","volume":"299 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"31","resultStr":"{\"title\":\"Fault diagnosis in scan-based BIST\",\"authors\":\"J. Rajski, J. Tyszer\",\"doi\":\"10.1109/TEST.1997.639704\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper presents a new fault diagnosis technique for scan-based BIST designs. It can be used for non-adaptive identification of the scan cells that are driven by erroneous signals, irrespective of the error multiplicity. The proposed scheme employs a simple scan cell selection hardware which in conjunction with a conventional signature analysis allows flexible tradeoffs between the test application time and the diagnostic resolution.\",\"PeriodicalId\":186340,\"journal\":{\"name\":\"Proceedings International Test Conference 1997\",\"volume\":\"299 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"31\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings International Test Conference 1997\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1997.639704\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings International Test Conference 1997","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1997.639704","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 31

摘要

提出了一种新的基于扫描的自适应测试系统故障诊断技术。它可以用于由错误信号驱动的扫描单元的非自适应识别，而不考虑错误的多重性。所提出的方案采用简单的扫描单元选择硬件，该硬件与传统的签名分析相结合，允许在测试应用时间和诊断分辨率之间进行灵活的权衡。

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Fault diagnosis in scan-based BIST

The paper presents a new fault diagnosis technique for scan-based BIST designs. It can be used for non-adaptive identification of the scan cells that are driven by erroneous signals, irrespective of the error multiplicity. The proposed scheme employs a simple scan cell selection hardware which in conjunction with a conventional signature analysis allows flexible tradeoffs between the test application time and the diagnostic resolution.

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Proceedings International Test Conference 1997

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