多项目晶圆(MPW)的隐形切割替代方案

Jen-Hsien Chang, Pei-Ling Chen, Chien-Chih Huang, Guo-Hao Cao, Ji-Ye Wang
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引用次数: 5

摘要

多项目晶圆(MPW)是为了节省成本和快速成型而设计的,但传统的刀片切割工艺耗时长,而且由于重复的刀片切割过程,导致模具损失的风险很高。隐形切割是由滨松光电公司(Hamamatsu Photonics)设计的刀片切割的替代解决方案,具有MPW切割解决方案的潜力。本文首次成功地提出了用隐形切割代替刀片切割的MPW切割方法,并证明了FT (Functional Test)的成品率。在这项研究中,研究小组评估了MPW切割的隐形切割过程。在评估过程中,观察到一些损伤MPW芯片的现象。本研究澄清了这一现象,并找到了解决方法。通过对该问题的求解,结果表明:隐形切割和刀片切割的成品率相当,隐形切割可以应用于MPW。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Alternative dicing solution of Multi-Project Wafer (MPW) by Stealth Dicing
Multi-Project Wafer (MPW) is designed for cost saving and fast prototype but conventional Blade Dicing process is time consuming and high risk to cause die loss because repetitive Blade Dicing process. Stealth Dicing is an alternative solution of Blade Dicing, patterned by Hamamatsu Photonics, which has potential for MPW dicing solution. This paper presents first successful MPW dicing by Stealth Dicing instead of Blade Dicing which FT (Functional Test) yield has been proved. In this study, the team evaluated the process of MPW dicing by Stealth Dicing. During the evaluation, some phenomenon has been observed which damage MPW chips. This study has clarified the phenomenon and found solution for the damage. After solving the problem, the result shows that yield of Stealth Dicing and Blade Dicing are comparable and Stealth Dicing is able to be used on MPW.
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