数字CMOS电路中互连打开引起的振荡和顺序行为

Proceedings International Test Conference 1997 Pub Date : 1997-11-03 DOI:10.1109/TEST.1997.639668

H. Konuk, F. Ferguson

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引用次数: 30

摘要

短路和开路是当今CMOS ic中最常见的缺陷类型。在本文中，我们首次证明了数字CMOS电路互连布线中的一个开路可以引起振荡或顺序行为。我们还分析和比较了影响互连打开和反馈桥接故障振荡或显示顺序行为概率的因素。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Oscillation and sequential behavior caused by interconnect opens in digital CMOS circuits

Shorts and opens are the most common types of defects in today's CMOS ICs. In this paper we show for the first time that an open in the interconnect wiring of a digital CMOS circuit can cause oscillation or sequential behavior. We also analyze and compare the factors affecting the probabilities for an interconnect open and a feedback bridging fault to oscillate or display sequential behavior.

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Proceedings International Test Conference 1997

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