{"title":"一种评估印刷电路板辐射敏感性的方法","authors":"G. Zhu, W. Thiel, J. Eric Bracken","doi":"10.1109/EPEPS.2016.7835431","DOIUrl":null,"url":null,"abstract":"Printed circuit boards (PCB) are subject to external electromagnetic interference. A validation tool to efficiently predict the worst-case induced voltages and currents is invaluable in the process of making PCB designs pass the immunity test for electromagnetic compliance. This paper proposes to use a 2.5-D hybrid finite-element-method (FEM) solver to characterize the radiated far field and use the reciprocity-based method to calculate the induced port voltages and currents due to an incident plane wave. This method can be used to analyze any full-size PCB. Good agreement with the results from a 3-D full-wave FEM is obtained at low frequencies, where the 2.5-D assumption for the fields in the PCB applies. Furthermore, the calculation time and memory consumption are significantly reduced.","PeriodicalId":241629,"journal":{"name":"2016 IEEE 25th Conference on Electrical Performance Of Electronic Packaging And Systems (EPEPS)","volume":"110 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A method to assess the radiated susceptibility of printed circuit boards\",\"authors\":\"G. Zhu, W. Thiel, J. Eric Bracken\",\"doi\":\"10.1109/EPEPS.2016.7835431\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Printed circuit boards (PCB) are subject to external electromagnetic interference. A validation tool to efficiently predict the worst-case induced voltages and currents is invaluable in the process of making PCB designs pass the immunity test for electromagnetic compliance. This paper proposes to use a 2.5-D hybrid finite-element-method (FEM) solver to characterize the radiated far field and use the reciprocity-based method to calculate the induced port voltages and currents due to an incident plane wave. This method can be used to analyze any full-size PCB. Good agreement with the results from a 3-D full-wave FEM is obtained at low frequencies, where the 2.5-D assumption for the fields in the PCB applies. Furthermore, the calculation time and memory consumption are significantly reduced.\",\"PeriodicalId\":241629,\"journal\":{\"name\":\"2016 IEEE 25th Conference on Electrical Performance Of Electronic Packaging And Systems (EPEPS)\",\"volume\":\"110 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE 25th Conference on Electrical Performance Of Electronic Packaging And Systems (EPEPS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEPS.2016.7835431\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 25th Conference on Electrical Performance Of Electronic Packaging And Systems (EPEPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEPS.2016.7835431","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A method to assess the radiated susceptibility of printed circuit boards
Printed circuit boards (PCB) are subject to external electromagnetic interference. A validation tool to efficiently predict the worst-case induced voltages and currents is invaluable in the process of making PCB designs pass the immunity test for electromagnetic compliance. This paper proposes to use a 2.5-D hybrid finite-element-method (FEM) solver to characterize the radiated far field and use the reciprocity-based method to calculate the induced port voltages and currents due to an incident plane wave. This method can be used to analyze any full-size PCB. Good agreement with the results from a 3-D full-wave FEM is obtained at low frequencies, where the 2.5-D assumption for the fields in the PCB applies. Furthermore, the calculation time and memory consumption are significantly reduced.