循环弯曲载荷下BGA焊点可靠性评估

Il-ho Kim, Soon-Bok Lee
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引用次数: 6

摘要

移动产品,如手机,PDA和笔记本电脑,受到许多不同的机械载荷,包括弯曲,扭曲,冲击和振动。在本研究中,对BGA封装进行了循环弯曲试验,以评估其疲劳寿命。采用电磁作动器,研制了适用于电子封装的专用弯曲试验机。采用非线性有限元模型模拟了BGA封装中焊点的机械弯曲变形。比较了无铅(95.5Sn4.0Ag0.5Cu)焊点与含铅(63Sn37Pb)焊点的疲劳寿命。当试样所受载荷较小时,无铅焊料比含铅焊料具有更长的疲劳寿命。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Reliability assessments of BGA solder joints under cyclic bending loads
Mobile products, such as cellular phones, PDA and notebook, are subjected to many different mechanical loads, which include bending, twisting, impact shock and vibration. In this study, a cyclic bending test of the BGA package was performed to evaluate the fatigue life. Special bending tester, which was suitable for electronic package, was developed using an electromagnetic actuator. A nonlinear finite element model was used to simulate the mechanical bending deformation of solder joint in BGA packages. The fatigue life of lead-free (95.5Sn4.0Ag0.5Cu) solder joints was compared with that of lead-contained (63Sn37Pb). When the applied load to the specimen is small, the lead-free solder has longer fatigue life than lead-contained solder.
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