M. Cho, N. Sathe, A. Raychowdhury, S. Mukhopadhyay
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Optimization of burn-in test for many-core processors through adaptive spatiotemporal power migration
We present adaptive spatiotemporal power migration (ASTPM) for burn-in of many core chips. ASTPM adapts the number of simultaneously stressed cores and dynamically varies their location to prevent thermal runaway, improve test-quality, and optimize burn-in time.
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