GaN hemt功率模块封装设计与性能评估

Chung-Hsiang Ho, Po-Chien Chou, Stone Cheng
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引用次数: 1

摘要

本文描述了功率模块封装的大功率AlGaN/GaN高电子迁移率晶体管(HEMTs)在硅衬底上的电子性能。在一个AlN衬底上安装了16个GaN芯片。在一个模块中有三个AlN衬底。每个设备都是线键并联,以增加额定功率。在不同的功率密度、脉冲长度和占空比下,测量了不同连接方式和器件尺寸的直流和脉冲电流-电压(ID-VDS)特性。我们发现了一些条件,使并行连接差降至零。由此可知,GaN的最大漏极电流为5.98A(98.8%)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
GaN HEMTs power module package design and performance evaluation
This paper described the electronic performance of power module packaged high-power AlGaN/GaN high electron mobility transistors (HEMTs) on silicon substrate. Sixteen GaN chips are mounted on one AlN substrate. There are three AlN substrate in one module. Each device is wire-bonded in parallel connection to increase the power rating. Both DC and pulsed current-voltage (ID-VDS) characteristics are measured for different connection and sizes of devices, at various of power densities, pulse lengths, and duty factors. We found some conditions that makes the parallel connection difference down to zero. According that, The GaN has maxima drain current=5.98A(98.8%).
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