用于高温操作的SiC-SBD封装

Z. Valdez-Nava, M. Kozako, S. Dinculescu, I. Omura, M. Hikita, T. Lebey
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引用次数: 6

摘要

使用宽带隙半导体(SiC, GaN)作为可能的解决方案,以满足日益增长的高温,高频电力电子的发展需求。这将有助于缩小当前电力电子系统的规模,并扩大其运行条件的范围。本文的目的是介绍使用能够在300°C以上工作的SiC肖特基势垒二极管封装全波整流桥的结果。二极管额定电压为1200v和50a。所建议的包装是基于绝缘气体封装和组件的堆叠。通过在室温下通过电桥馈电和在充满气体的绝缘加热室中施加高压来测试整流功能。结果表明,所提出的互连类型在整流条件下可以承受至少10a和200v的电压。气体封装允许二极管在高达350°C的高压条件下工作,即使在该温度下二极管泄漏电流过高而无法进行适当的整流。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Packaging of SiC-SBD for high temperature operation
Using wideband gap semiconductors (SiC, GaN) appears as possible solution to the growing demand for the development of high temperature, high frequencies power electronics. This will help downsizing the current Power Electronics systems and extend their range of operation conditions. The aim of this paper is to present the results obtained concerning the packaging of a full-wave rectifying bridge using SiC Schottky Barrier Diodes, capable to operate above 300°C. The diodes are rated 1200 V and 50 A. The proposed packaging is based on an insulating-gas encapsulation and stacking of the components. The rectifying function was tested by feeding a current trough the bridge at room temperature, and while applying high voltage in an insulating gas-filled heated chamber. Results show that the type of interconnection proposed can withstand at least 10 A and 200 V in rectifying conditions. Gas encapsulation allowed for an operation of the diodes under high voltage conditions up to 350°C even if at this temperature diode leakage current is too high to perform an appropriate rectification.
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