用直流扫描试验模拟过渡故障的实验结果

16th Asian Test Symposium (ATS 2007) Pub Date : 2007-10-08 DOI:10.1109/ATS.2007.50

Wataru Kawamura, Takeshi Onodera

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引用次数: 1

摘要

结果表明，直流扫描ATPG算法在实际设计中用于过渡故障检测是有效的。尽管扫描使能信号的高速切换需要一些DFT辅助，如流水线，但经典的直流扫描ATPG算法似乎值得考虑用于交流扫描ATPG运行的第一轮。

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Experimental Results of Transition Fault Simulation with DC Scan Tests

The results indicate the effectiveness of the DC scan ATPG algorithm for transition fault detection in actual designs. Even though the at-speed toggle of the scan enable signal needs some DFT assistance such as pipelining, the classical DC scan ATPG algorithm seems worth considering for the first pass of AC scan ATPG runs.

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来源期刊

16th Asian Test Symposium (ATS 2007)

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