三态电路和双向I/O的并行模式快速故障仿真

Proceedings., International Test Conference Pub Date : 1994-10-02 DOI:10.1109/TEST.1994.528005

J. V. D. Linden, M. Konijnenburg, A. V. Goor

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引用次数: 9

摘要

工业电路设计通常包含三态元件，如总线和驱动器、传输门和双向I/O。提出了一种5值快速故障仿真方法和一种能够处理这些电路的4值并行模式版本。结果表明，所提方法在三态元存在时是有效的，与二值或三值故障模拟相比，性能下降很小。

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Parallel pattern fast fault simulation for three-state circuits and bidirectional I/O

Industrial circuit designs commonly contain three-state elements, such as buses and drivers, transmission gates, and bidirectional I/O. A 5-valued fast fault simulation method and a 4-valued parallel pattern version that can handle these circuits are presented. Results demonstrate the effectiveness of the proposed methods in the presence of three-state elements, and show but a small performance degradation compared to 2- or 3-valued fault simulation.

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Proceedings., International Test Conference

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