{"title":"分层测试使用IEEE标准1149.5模块测试和维护从接口模块","authors":"Jin-Hua Hong, Chung-Hung Tsai, Cheng-Wen Wu","doi":"10.1109/ATS.1996.555136","DOIUrl":null,"url":null,"abstract":"An IEEE Std 1149.5 MTM-Bus Slave interface module is presented, which is used for direct access to 1149.1 chip-level buses and hierarchical test. All the standard 1149.1 functions, such as SAMPLE/PRELOAD, EXTEST, BYPASS, and even RUNBIST, can be performed within three 1149.5 Read/Write-Data message cycles. The messages are transmitted between the MTM-bus Master module (M-module) and the Slave module (S-module). We adopt the Full TAP Control (FTC) method to activate the 1149.1 Boundary-Scan paths via the 1149.5 MTM-Bus. A personal computer is used as the M-module.","PeriodicalId":215252,"journal":{"name":"Proceedings of the Fifth Asian Test Symposium (ATS'96)","volume":"51 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Hierarchical testing using the IEEE Std 1149.5 module test and maintenance slave interface module\",\"authors\":\"Jin-Hua Hong, Chung-Hung Tsai, Cheng-Wen Wu\",\"doi\":\"10.1109/ATS.1996.555136\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An IEEE Std 1149.5 MTM-Bus Slave interface module is presented, which is used for direct access to 1149.1 chip-level buses and hierarchical test. All the standard 1149.1 functions, such as SAMPLE/PRELOAD, EXTEST, BYPASS, and even RUNBIST, can be performed within three 1149.5 Read/Write-Data message cycles. The messages are transmitted between the MTM-bus Master module (M-module) and the Slave module (S-module). We adopt the Full TAP Control (FTC) method to activate the 1149.1 Boundary-Scan paths via the 1149.5 MTM-Bus. A personal computer is used as the M-module.\",\"PeriodicalId\":215252,\"journal\":{\"name\":\"Proceedings of the Fifth Asian Test Symposium (ATS'96)\",\"volume\":\"51 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-11-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the Fifth Asian Test Symposium (ATS'96)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.1996.555136\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the Fifth Asian Test Symposium (ATS'96)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1996.555136","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Hierarchical testing using the IEEE Std 1149.5 module test and maintenance slave interface module
An IEEE Std 1149.5 MTM-Bus Slave interface module is presented, which is used for direct access to 1149.1 chip-level buses and hierarchical test. All the standard 1149.1 functions, such as SAMPLE/PRELOAD, EXTEST, BYPASS, and even RUNBIST, can be performed within three 1149.5 Read/Write-Data message cycles. The messages are transmitted between the MTM-bus Master module (M-module) and the Slave module (S-module). We adopt the Full TAP Control (FTC) method to activate the 1149.1 Boundary-Scan paths via the 1149.5 MTM-Bus. A personal computer is used as the M-module.
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