He Sheng-zong, Wang You-liang, Peng Ze-ya, Zhang Yin, Chen Jin-Tao, Zhu Bin-Rue, Jiang Jian-feng
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Case Study and Application on Failure Analysis for Power Device
Power devices are widely used. Due to over burning and incidental destruction, direct failure analysis can't easily identify the real cause of failure. It is an essential technology for the analysis department of power device users to find out the evidence of the failure cause quickly and effectively, and verify it. Taking the application scenario of household appliances as an example, a large number of failure cases of MOSFET, IPM, IGBT for household appliances are summarized. A typical case set with different defects caused by packaging defects, process manufacturing and insufficient application protection is formed. Corresponding analysis strategies and skills and essentials are established. The summary of these failure cases and methods has a guiding role in the material selection, product design, manufacture and application protection for power devices.