CMOS低差稳压器件的模具裂纹失效研究

2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Pub Date : 2016-07-18 DOI:10.1109/IPFA.2016.7564273

Francis Nikolai Lupena, Siew Mei Teo, Rowin V. Galarce

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引用次数: 0

摘要

最近在低差(LDO)稳压器上出现故障，其中客户正在经历超出规格的输出电压。本文旨在通过详细的失效分析，并将客户投诉与观察到的模具裂纹联系起来，找出失效的确切根源。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Failure investigation of a die crack on a CMOS low dropout regulator device

There are recent failures on a Low Dropout (LDO) Regulator where the customer is experiencing an out of specification output voltage. This paper aims to investigate the exact root cause of the failure by detailed failure analysis and relating the customer complaint to the die crack observed.

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2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

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