化合物半导体车间可靠性历史回顾

[Reliability of Compound Semiconductors] ROCS Workshop, 2005. Pub Date : 2005-12-27 DOI:10.1109/ROCS.2005.201549

W. Roesch

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引用次数: 6

摘要

本次讨论旨在回顾过去二十年来在可靠性方面取得的进展，并从中总结出一些经验教训。虽然讲习班单独处理各种具体问题，但它是各种数据、信息和经验的积累，构成了评估可靠性的基础。最后，可靠性只是对事实和统计数据的深刻理解。经过20年的研讨会会议，是时候回顾、比较和讨论化合物半导体可靠性的进展和未来了。

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Reliability of compound semiconductor workshop historical review

This discussion is meant to look back at reliability progress over the last two decades and identify a few items that have been learned. While the Workshop addresses various specific Issues individually, It is the accumulation of a variety of data, information, and experience which forms the basis of an assessment of reliability. In the end, reliability is simply an insightful perception of facts and statistics. After 20 years of Workshop meetings, it is time to review, compare, and discuss the progress and the future of Compound Semiconductor Reliability.

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[Reliability of Compound Semiconductors] ROCS Workshop, 2005.

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