超分辨率显微镜中宽谱去噪的边缘效应。

Tao Cheng, Yingshan Wang
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引用次数: 0

摘要

在超分辨率显微镜的随机光学重建显微镜(STORM)原始图像采集过程中,噪声是不可避免的。噪声不仅降低了超分辨率图像的时间和空间分辨率,而且导致超分辨率图像重建的失败。宽谱去噪(WSD)可以有效地去除STORM原始图像中的各种随机噪声(如泊松噪声和高斯噪声),以提高超分辨率图像的重建效果。我们发现WSD中存在明显的边缘效应,并研究了它对STORM原始图像去噪和超分辨率图像重建的影响。然后提出了抑制边缘效应的方法。仿真和实际实验结果表明,边缘修剪可以有效地抑制边缘效应,从而实现更好的超分辨率图像重建。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Edge effect of wide spectrum denoising in super-resolution microscopy.

During the stochastic optical reconstruction microscope (STORM) raw image acquisition in super-resolution microscopy, noise is inevitable. Noise not only reduces the temporal and spatial resolution of the super-resolution image but also leads to the failure of super-resolution image reconstruction. Wide spectrum denoising (WSD) can effectively remove various random noises (such as Poisson noise and Gaussian noise) from the STORM raw image to improve the super-resolution image reconstruction. We found that there is an obvious edge effect in WSD, and its influence on STORM raw image denoising and super-resolution image reconstruction is studied. We then proposed the method of restraining edge effect. The simulation and real experiment results show that edge trimming can effectively suppress the edge effect, thus leading to better super-resolution image reconstruction.

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