Soft X-ray spectro-ptychography of boron nitride nanobamboos, carbon nanotubes and permalloy nanorods.

IF 2.4 3区物理与天体物理 Q2 INSTRUMENTS & INSTRUMENTATION

Journal of Synchrotron Radiation Pub Date : 2023-07-01 Epub Date: 2023-05-05 DOI:10.1107/S1600577523003399

Jaianth Vijayakumar, Hao Yuan, Nicolas Mille, Stefan Stanescu, Sufal Swaraj, Vincent Favre-Nicolin, Ebrahim Najafi, Adam P Hitchcock, Rachid Belkhou

{"title":"Soft X-ray spectro-ptychography of boron nitride nanobamboos, carbon nanotubes and permalloy nanorods.","authors":"Jaianth Vijayakumar, Hao Yuan, Nicolas Mille, Stefan Stanescu, Sufal Swaraj, Vincent Favre-Nicolin, Ebrahim Najafi, Adam P Hitchcock, Rachid Belkhou","doi":"10.1107/S1600577523003399","DOIUrl":null,"url":null,"abstract":"<p><p>Spectro-ptychography offers improved spatial resolution and additional phase spectral information relative to that provided by scanning transmission X-ray microscopes. However, carrying out ptychography at the lower range of soft X-ray energies (e.g. below 200 eV to 600 eV) on samples with weakly scattering signals can be challenging. Here, results of soft X-ray spectro-ptychography at energies as low as 180 eV are presented, and its capabilities are illustrated with results from permalloy nanorods (Fe 2p), carbon nanotubes (C 1s) and boron nitride bamboo nanostructures (B 1s, N 1s). The optimization of low-energy X-ray spectro-ptychography is described and important challenges associated with measurement approaches, reconstruction algorithms and their effects on the reconstructed images are discussed. A method for evaluating the increase in radiation dose when using overlapping sampling is presented.</p>","PeriodicalId":17114,"journal":{"name":"Journal of Synchrotron Radiation","volume":"30 Pt 4","pages":"746-757"},"PeriodicalIF":2.4000,"publicationDate":"2023-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10325009/pdf/","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Synchrotron Radiation","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.1107/S1600577523003399","RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2023/5/5 0:00:00","PubModel":"Epub","JCR":"Q2","JCRName":"INSTRUMENTS & INSTRUMENTATION","Score":null,"Total":0}

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Abstract

Spectro-ptychography offers improved spatial resolution and additional phase spectral information relative to that provided by scanning transmission X-ray microscopes. However, carrying out ptychography at the lower range of soft X-ray energies (e.g. below 200 eV to 600 eV) on samples with weakly scattering signals can be challenging. Here, results of soft X-ray spectro-ptychography at energies as low as 180 eV are presented, and its capabilities are illustrated with results from permalloy nanorods (Fe 2p), carbon nanotubes (C 1s) and boron nitride bamboo nanostructures (B 1s, N 1s). The optimization of low-energy X-ray spectro-ptychography is described and important challenges associated with measurement approaches, reconstruction algorithms and their effects on the reconstructed images are discussed. A method for evaluating the increase in radiation dose when using overlapping sampling is presented.

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氮化硼纳米竹、碳纳米管和高合金纳米棒的软 X 射线光谱层析。

相对于扫描透射 X 射线显微镜提供的信息，光谱层析技术可提供更高的空间分辨率和额外的相位光谱信息。然而，在较低的软 X 射线能量范围（如低于 200 eV 至 600 eV）内对散射信号较弱的样品进行层析成像可能具有挑战性。本文介绍了能量低至 180 eV 的软 X 射线光谱层析成像的结果，并通过高合金纳米棒（Fe 2p）、碳纳米管（C 1s）和氮化硼竹纳米结构（B 1s、N 1s）的结果说明了其能力。介绍了低能 X 射线光谱透视学的优化，并讨论了与测量方法、重建算法及其对重建图像的影响有关的重要挑战。介绍了使用重叠采样时评估辐射剂量增加的方法。

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来源期刊

Journal of Synchrotron Radiation 物理-光学

CiteScore

5.10

自引率

12.00%

发文量

289

审稿时长

4-8 weeks

期刊介绍： Synchrotron radiation research is rapidly expanding with many new sources of radiation being created globally. Synchrotron radiation plays a leading role in pure science and in emerging technologies. The Journal of Synchrotron Radiation provides comprehensive coverage of the entire field of synchrotron radiation and free-electron laser research including instrumentation, theory, computing and scientific applications in areas such as biology, nanoscience and materials science. Rapid publication ensures an up-to-date information resource for scientists and engineers in the field.