Palladium surface finishes for copper wire bonding (Part I: The selection of surface finishes)

M. Ozkok, Bill Kao, H. Clauberg
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Abstract

During the past two years, fine pitch copper wire bonding has finally entered high volume production. It is estimated that nearly 15% of all wire bonders used in production are now equipped for copper wire bonding. Most of these are used exclusively for copper wire bonding. In terms of pitch, copper wire is only barely lagging behind the most advanced gold applications. The most commonly used copper wire is 20um in diameter and 18um copper wire is entering final qualification. Evaluations with even finer wire are underway. Although some technical challenges remain, many years of research have now resolved most of the problems associated with copper wire bonding and attention is beginning to shift from merely ensuring reliable manufacturing processes to optimizing processes for efficiency and throughput. The most advanced wire bonders now have pre-configured processes specifically designed for copper. In addition to throughput optimization, further cost reductions are being sought. Among these is the desire to eliminate the high-cost gold not just from the wire, but also from the substrate. On the substrate side the electronics packaging industry still works with electrolytic nickel / electrolytic (soft) gold (Ni/Au) for copper wire bond applications. This surface finish works with copper wire bonding but includes some disadvantages, such as: — Thick expensive Au layers of 0.1 to 0.4μm — Electrically connected pads (bussing for the plating) which require added space on the substrate. — Pd-coated copper wire often delivers better results on gold covered finishes, but is two to three times more expensive as pure copper wire. Furthermore electrolytic Ni/Au was not chosen as a result of in-depth investigations for the most effective surface finish. The selection was made because it was the surface finish with the highest distribution in the market for wire bond packages. This paper is offering the results of a two company joint work regarding an alternative copper wire bondable surface finish for substrates mainly with palladium as the final copper wire bondable layer. This offers further cost reduction possibilities. Furthermore, copper palladium intermetallics are regarded as very reliable.
铜线焊用钯表面处理剂(第1部分:表面处理剂的选择)
在过去的两年里,细间距铜线键合终于进入了大批量生产。据估计,目前生产中使用的所有焊丝机中有近15%配备了铜线焊丝。其中大多数是专门用于铜线粘接。就螺距而言,铜线仅略落后于最先进的黄金应用。最常用的铜线直径为20um, 18um铜线进入最终鉴定。使用更细导线的评估正在进行中。尽管仍然存在一些技术挑战,但多年的研究已经解决了与铜线键合相关的大部分问题,人们的注意力开始从仅仅确保可靠的制造工艺转向优化工艺以提高效率和产量。目前最先进的焊丝机都有专门为铜设计的预配置工艺。除了吞吐量优化之外,还在寻求进一步降低成本。其中之一是希望不仅从电线中,而且从衬底中消除高成本的金。在衬底方面,电子封装行业仍然使用电解镍/电解(软)金(Ni/Au)用于铜线粘合应用。这种表面处理与铜线结合使用,但存在一些缺点,例如:- 0.1至0.4μm的昂贵的厚金层-电连接焊盘(用于电镀的母线)需要在基板上增加空间。-镀钯铜线通常在镀金表面上效果更好,但价格是纯铜线的两到三倍。此外,由于深入研究,没有选择电解Ni/Au来获得最有效的表面光洁度。之所以进行选择,是因为它是在线键合包装市场上分布最高的表面光洁度。本文提供了两家公司联合工作的结果,关于主要以钯作为最终铜线可粘合层的基材的替代铜线可粘合表面处理。这提供了进一步降低成本的可能性。此外,铜钯金属间化合物被认为是非常可靠的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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