{"title":"A 5-Gbps Test System for Wafer-Level Packaged Devices","authors":"A. Majid, D. Keezer","doi":"10.1109/TEPM.2009.2017773","DOIUrl":null,"url":null,"abstract":"This paper describes an economical approach to high-speed testing of wafer-level packaged logic devices. The solution assumes that the devices have built-in self-test features, thereby reducing the complexity of external test instrumentation required. A stand-alone miniature tester is connected to the top of a wafer probe card, transmitting and receiving multiple high-speed (2-5 Gbps) signals. To keep costs low, the tester uses off-the-shelf components. However, its performance in some respects exceeds that of traditional automated test equipment (ATE). Measurements demonstrate the tester producing 5-Gbps signals with a plusmn 18-ps timing accuracy. The generated signals exhibit low jitter ( ~ 35 ps) and have a rise time of about 60 ps. Similar performance is also shown for signal capture.","PeriodicalId":55010,"journal":{"name":"IEEE Transactions on Electronics Packaging Manufacturing","volume":"255 1","pages":"144-151"},"PeriodicalIF":0.0000,"publicationDate":"2009-06-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Electronics Packaging Manufacturing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEPM.2009.2017773","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
This paper describes an economical approach to high-speed testing of wafer-level packaged logic devices. The solution assumes that the devices have built-in self-test features, thereby reducing the complexity of external test instrumentation required. A stand-alone miniature tester is connected to the top of a wafer probe card, transmitting and receiving multiple high-speed (2-5 Gbps) signals. To keep costs low, the tester uses off-the-shelf components. However, its performance in some respects exceeds that of traditional automated test equipment (ATE). Measurements demonstrate the tester producing 5-Gbps signals with a plusmn 18-ps timing accuracy. The generated signals exhibit low jitter ( ~ 35 ps) and have a rise time of about 60 ps. Similar performance is also shown for signal capture.