Investigation and Comparison of Aging Effects in SAC+X Solders Exposed to High Temperatures

Jing Wu, M. Alam, KM Rafidh Hassan, J. Suhling, P. Lall
{"title":"Investigation and Comparison of Aging Effects in SAC+X Solders Exposed to High Temperatures","authors":"Jing Wu, M. Alam, KM Rafidh Hassan, J. Suhling, P. Lall","doi":"10.1109/ectc32862.2020.00085","DOIUrl":null,"url":null,"abstract":"Microstructural evolution occurs in lead free Sn-Ag- Cu (SAC) solder joints exposed to isothermal aging. Such changes lead to degradations in the mechanical properties and creep behavior of the solder, and can result in dramatic reductions in the board level reliability of lead-free electronic assemblies subjected to aging. In our recent research, Scanning Electron Microscopy (SEM) has been used to: (1) monitor aging induced microstructural changes occurring within fixed regions in selected lead-free solder joints, (2) create time-lapse imagery of the microstructure evolution, and (3) analyze the microstructural changes quantitatively and correlate to the observed mechanical behavior evolution. This approach has removed the limitations of many prior studies where aged and non-aged microstructures were taken from two different samples and could only be qualitatively compared.In our recent papers presented at ECTC 2018 and 2019, the developed approach was used to observe the microstructure evolutions in SAC305 (96.5Sn-3.0Ag-0.5Cu) and SAC_Q (SAC+Bi) solder joint samples for up to 2000 hours of aging at T = 125 °C. In the current study, we have extended this work for longer aging times up to 7000 hours, and we have also examined microstructural changes for aging at another temperature (T = 100 °C). Finally, a more extensive study has been performed for short term aging up to 270 hours, which is when the majority of aging induced changes occur. The aging induced changes in microstructure have been correlated with the changes in mechanical behavior measured using uniaxial tensile testing.The area and diameter of each IMC particle were tracked during the aging process using the recorded images and imaging processing software. As expected, the analysis of the evolving SAC305 and SAC_Q microstructures showed a significant amount of diffusion of silver and bismuth in the beta-tin matrix during aging. In particular, Ag3Sn particles coalesced during aging leading to a decrease in the number of particles. Any bismuth in the SAC_Q microstructure was observed to quickly go into solution, resulting in solid solution strengthening. This primary occurred within the beta-Sn dendrites, but also in the Ag3Sn intermetallic rich regions between dendrites. The presence of bismuth in was also found to slow the diffusion process that coarsens the Ag3Sn IMC particles. The combination solid solution strengthening and a lower diffusion rate for Ag lead to reduced aging effects in the SAC+Bi alloy relative to the SAC305 solder alloy.The mechanical behavior degradations in the two alloys were also investigated. Before testing, the solder uniaxial specimens were aged (preconditioned) at T = 125 °C. At each aging temperature, several durations of aging were considered including 0, 2, 6, 12, and 24 hours. Uniaxial tensile tests were then performed on the aged specimens at high temperature (T = 125 °C). Using the measured data, the evolutions of the high temperature stress-strain behavior were determined as a function of aging temperature and aging time, and models describing the evolution of the mechanical properties with extreme aging were established.The SAC_Q alloy was found to have significantly better high temperature mechanical properties relative to SAC305 at all prior aging conditions. In particular, the initial modulus and ultimate tensile strength of SAC305 experienced large degradations during high temperature aging, whereas the same properties of SAC_Q changed only slightly. These changes in mechanical behavior correlated well with the observed increases in the average IMC particle diameter and decreases in the number of IMC particles. The microstructural and material property degradations were especially large for SAC305 during the initial 50 hours of aging.","PeriodicalId":6722,"journal":{"name":"2020 IEEE 70th Electronic Components and Technology Conference (ECTC)","volume":"8 1","pages":"492-503"},"PeriodicalIF":0.0000,"publicationDate":"2020-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE 70th Electronic Components and Technology Conference (ECTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ectc32862.2020.00085","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

Microstructural evolution occurs in lead free Sn-Ag- Cu (SAC) solder joints exposed to isothermal aging. Such changes lead to degradations in the mechanical properties and creep behavior of the solder, and can result in dramatic reductions in the board level reliability of lead-free electronic assemblies subjected to aging. In our recent research, Scanning Electron Microscopy (SEM) has been used to: (1) monitor aging induced microstructural changes occurring within fixed regions in selected lead-free solder joints, (2) create time-lapse imagery of the microstructure evolution, and (3) analyze the microstructural changes quantitatively and correlate to the observed mechanical behavior evolution. This approach has removed the limitations of many prior studies where aged and non-aged microstructures were taken from two different samples and could only be qualitatively compared.In our recent papers presented at ECTC 2018 and 2019, the developed approach was used to observe the microstructure evolutions in SAC305 (96.5Sn-3.0Ag-0.5Cu) and SAC_Q (SAC+Bi) solder joint samples for up to 2000 hours of aging at T = 125 °C. In the current study, we have extended this work for longer aging times up to 7000 hours, and we have also examined microstructural changes for aging at another temperature (T = 100 °C). Finally, a more extensive study has been performed for short term aging up to 270 hours, which is when the majority of aging induced changes occur. The aging induced changes in microstructure have been correlated with the changes in mechanical behavior measured using uniaxial tensile testing.The area and diameter of each IMC particle were tracked during the aging process using the recorded images and imaging processing software. As expected, the analysis of the evolving SAC305 and SAC_Q microstructures showed a significant amount of diffusion of silver and bismuth in the beta-tin matrix during aging. In particular, Ag3Sn particles coalesced during aging leading to a decrease in the number of particles. Any bismuth in the SAC_Q microstructure was observed to quickly go into solution, resulting in solid solution strengthening. This primary occurred within the beta-Sn dendrites, but also in the Ag3Sn intermetallic rich regions between dendrites. The presence of bismuth in was also found to slow the diffusion process that coarsens the Ag3Sn IMC particles. The combination solid solution strengthening and a lower diffusion rate for Ag lead to reduced aging effects in the SAC+Bi alloy relative to the SAC305 solder alloy.The mechanical behavior degradations in the two alloys were also investigated. Before testing, the solder uniaxial specimens were aged (preconditioned) at T = 125 °C. At each aging temperature, several durations of aging were considered including 0, 2, 6, 12, and 24 hours. Uniaxial tensile tests were then performed on the aged specimens at high temperature (T = 125 °C). Using the measured data, the evolutions of the high temperature stress-strain behavior were determined as a function of aging temperature and aging time, and models describing the evolution of the mechanical properties with extreme aging were established.The SAC_Q alloy was found to have significantly better high temperature mechanical properties relative to SAC305 at all prior aging conditions. In particular, the initial modulus and ultimate tensile strength of SAC305 experienced large degradations during high temperature aging, whereas the same properties of SAC_Q changed only slightly. These changes in mechanical behavior correlated well with the observed increases in the average IMC particle diameter and decreases in the number of IMC particles. The microstructural and material property degradations were especially large for SAC305 during the initial 50 hours of aging.
高温下SAC+X焊料老化效应的研究与比较
无铅Sn-Ag- Cu (SAC)焊点在等温时效下发生显微组织演变。这种变化导致焊料的机械性能和蠕变行为的退化,并可能导致电路板级无铅电子组件的可靠性急剧降低。在我们最近的研究中,扫描电子显微镜(SEM)已被用于:(1)监测在选定的无铅焊点的固定区域内发生的老化引起的显微组织变化,(2)创建显微组织演变的延时图像,以及(3)定量分析显微组织变化并与观察到的力学行为演变相关联。这种方法消除了许多先前研究的局限性,这些研究从两个不同的样品中提取了老化和非老化的微观结构,并且只能进行定性比较。在我们最近在ECTC 2018和2019上发表的论文中,使用开发的方法观察了SAC305 (96.5Sn-3.0Ag-0.5Cu)和SAC_Q (SAC+Bi)焊点样品在T = 125℃下时效长达2000小时的微观组织演变。在目前的研究中,我们将这项工作延长到7000小时,并且我们还研究了在另一个温度下(T = 100°C)老化时的微观结构变化。最后,一项更广泛的研究对长达270小时的短期衰老进行了研究,这是大多数衰老引起的变化发生的时间。时效引起的微观组织变化与单轴拉伸试验测量的力学行为变化相关。利用记录的图像和成像处理软件对老化过程中各IMC颗粒的面积和直径进行了跟踪。正如预期的那样,对SAC305和SAC_Q微观组织的分析表明,在时效过程中,β -锡基体中有大量的银和铋扩散。特别是在时效过程中,Ag3Sn颗粒聚结导致颗粒数量减少。在SAC_Q微观结构中,任何铋都能迅速进入溶液,导致固溶强化。这主要发生在β - sn枝晶内部,但也发生在枝晶之间富含Ag3Sn金属间质的区域。铋的存在也减缓了Ag3Sn IMC颗粒粗化的扩散过程。与SAC305钎料合金相比,SAC+Bi合金的复合固溶强化和Ag的较低扩散速率降低了时效效应。研究了两种合金的力学性能退化。在测试前,焊料单轴试样在T = 125℃下进行时效(预处理)。在每个时效温度下,考虑了几种时效时间,包括0、2、6、12和24小时。然后对时效试样进行高温(T = 125℃)单轴拉伸试验。利用实测数据,确定了高温应力-应变行为随时效温度和时效时间的变化规律,并建立了极限时效力学性能变化模型。结果表明,在所有预时效条件下,SAC_Q合金的高温力学性能都明显优于SAC305。其中,SAC305的初始模量和极限抗拉强度在高温时效过程中有较大的下降,而SAC_Q的相同性能变化不大。这些力学行为的变化与观察到的IMC颗粒平均直径的增加和IMC颗粒数量的减少密切相关。SAC305在时效前50小时的微观组织和材料性能退化尤为明显。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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