{"title":"Experimental considerations in electron beam transport on a nanophotonic chip using alternating phase focusing","authors":"R. Shiloh, T. Chlouba, P. Hommelhoff","doi":"10.1116/6.0001598","DOIUrl":null,"url":null,"abstract":"Not long after the laser was invented, it has been marked as a candidate source of strong, high-frequency electromagnetic radiation for acceleration of particles. Indeed, while the complex particle accelerator facilities today are an astonishing culmination of decades of work contributed by generations of physicists, engineers, and a host of scientists, new trends and acceleration technologies have been recently proposed and demonstrated. One of these technologies involves the miniaturization of particle accelerators, which is achieved by replacing the radio-frequency electromagnetic fields accelerating the particles with fields in the optical frequency range, using lasers. This entails using nanophotonics structures to provide the required field distribution. Recently, individual elements towards the nanophotonics counterpart of RF accelerators have been demonstrated. Similarly, active electron transport through such a structure has been shown, which was based on the concept of alternating phase focusing. In this contribution, we discuss and augment on the recently-demonstrated principle of alternating phase focusing using optical frequencies, and provide new insights from relevant simulations and experiments. In particular, we show how to identify possible imprecisions and parasitic effects from time delay scans and discuss how the transmission of electrons through the nanometric structure depends on the temporal overlap between electron and laser pulses, and show how the incidence angle of the electron beam can affect the measured transmission of electrons through the structure.","PeriodicalId":17495,"journal":{"name":"Journal of Vacuum Science & Technology B","volume":"112 1","pages":""},"PeriodicalIF":1.4000,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Vacuum Science & Technology B","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1116/6.0001598","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Not long after the laser was invented, it has been marked as a candidate source of strong, high-frequency electromagnetic radiation for acceleration of particles. Indeed, while the complex particle accelerator facilities today are an astonishing culmination of decades of work contributed by generations of physicists, engineers, and a host of scientists, new trends and acceleration technologies have been recently proposed and demonstrated. One of these technologies involves the miniaturization of particle accelerators, which is achieved by replacing the radio-frequency electromagnetic fields accelerating the particles with fields in the optical frequency range, using lasers. This entails using nanophotonics structures to provide the required field distribution. Recently, individual elements towards the nanophotonics counterpart of RF accelerators have been demonstrated. Similarly, active electron transport through such a structure has been shown, which was based on the concept of alternating phase focusing. In this contribution, we discuss and augment on the recently-demonstrated principle of alternating phase focusing using optical frequencies, and provide new insights from relevant simulations and experiments. In particular, we show how to identify possible imprecisions and parasitic effects from time delay scans and discuss how the transmission of electrons through the nanometric structure depends on the temporal overlap between electron and laser pulses, and show how the incidence angle of the electron beam can affect the measured transmission of electrons through the structure.
期刊介绍:
Journal of Vacuum Science & Technology B emphasizes processing, measurement and phenomena associated with micrometer and nanometer structures and devices. Processing may include vacuum processing, plasma processing and microlithography among others, while measurement refers to a wide range of materials and device characterization methods for understanding the physics and chemistry of submicron and nanometer structures and devices.