Using static linear response theory to describe field emission field enhancement and a field-induced insulator-conductor transition

IF 1.4 4区工程技术

Journal of Vacuum Science & Technology B Pub Date : 2021-12-01 DOI:10.1116/6.0001550

C. P. de Castro, T. A. de Assis, R. Rivelino, F. Mota, C. D. de Castilho

引用次数: 2

查看原文本刊更多论文

用静态线性响应理论描述场发射、场增强和场致绝缘子-导体跃迁

本文章由计算机程序翻译，如有差异，请以英文原文为准。

求助全文

约1分钟内获得全文求助全文

来源期刊

Journal of Vacuum Science & Technology B 工程技术-工程：电子与电气

自引率

14.30%

发文量

审稿时长

2.5 months

期刊介绍： Journal of Vacuum Science & Technology B emphasizes processing, measurement and phenomena associated with micrometer and nanometer structures and devices. Processing may include vacuum processing, plasma processing and microlithography among others, while measurement refers to a wide range of materials and device characterization methods for understanding the physics and chemistry of submicron and nanometer structures and devices.