Imprint-Through Mold Via (i-TMV) with High Aspect Ratio and Narrow Pitch for Antenna in Package

Xinrong Li, T. Ogawa, T. Shibata, S. Yoneda, N. Suzuki, T. Nonaka
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引用次数: 2

Abstract

The imprint-Through Mold Via was proposed for electromagnetic interference (EMI) shielding of Antenna in Package (AiP) application. The 300 μm-height via array could be successfully imprinted by using the silicon master which has 743 pillars with the diameter of 100 μm, pitch of 200 μm and height of 370 μm, and the via array was well filled by vacuum printing method with newly developed conductive paste utilizing transient liquid phase sintering. In order to evaluate the electric characteristics of the via array, a daisy-chain test vehicle (TV) which could connect all the vias together was fabricated. In the result of the reliability test, no electrical failure was confirmed of this daisy-chain.
用于封装天线的高宽高比窄间距压印通模通孔(i-TMV)
提出了一种用于封装天线(AiP)屏蔽电磁干扰的压印通模孔。采用直径为100 μm、间距为200 μm、高度为370 μm的743根硅母柱可成功印刻出高度为300 μm的通孔阵列,并利用瞬态液相烧结新研制的导电浆料采用真空印刷方法填充通孔阵列。为了评估通孔阵列的电气特性,制作了一种将所有通孔连接在一起的菊花链测试车(TV)。可靠性试验结果表明,该雏菊链无电气故障。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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