Comparison of the effective parameters of single-tip tungsten emitter using Fowler–Nordheim and Murphy–Good plots

IF 1.4 4区 工程技术
E. O. Popov, Sergey Filippov, A. G. Kolosko, A. Knápek
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引用次数: 4

Abstract

A study of single-tip tungsten emitters with the construction of current–voltage dependences in quadratic Fowler–Nordheim coordinates and modified coordinates (Murphy–Good plot that depend on the value of the work function) in real-time has been carried out. The statistical data on the value of the emission area and the field enhancement factor were accumulated. The statistical data on the voltage power in the pre-exponential factor were obtained by plotting the dependence of the notional emission area on the dimensionless field at the tip apex in the coordinates ln( Im/ Jk) versus ln( f). An empirical formula is proposed that uses a correction for the power of voltage, taking into account the shape of the tip.
采用Fowler-Nordheim图和Murphy-Good图比较单尖钨极发射极的有效参数
采用二次型Fowler-Nordheim坐标和修正坐标(依赖功函数值的Murphy-Good图)建立了电流-电压依赖关系,对单尖钨源进行了实时研究。积累了发射面积值和场增强因子的统计数据。通过在坐标ln(Im/ Jk)与ln(f)中绘制概念发射面积对尖端尖端无因次场的依赖关系,获得了指数前因子中电压功率的统计数据。在考虑尖端形状的情况下,提出了一个使用电压功率校正的经验公式。
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来源期刊
Journal of Vacuum Science & Technology B
Journal of Vacuum Science & Technology B 工程技术-工程:电子与电气
自引率
14.30%
发文量
0
审稿时长
2.5 months
期刊介绍: Journal of Vacuum Science & Technology B emphasizes processing, measurement and phenomena associated with micrometer and nanometer structures and devices. Processing may include vacuum processing, plasma processing and microlithography among others, while measurement refers to a wide range of materials and device characterization methods for understanding the physics and chemistry of submicron and nanometer structures and devices.
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