Advanced flexible CMOS integrated circuits on plastic enabled by controlled spalling technology

D. Shahrjerdi, S. Bedell, A. Khakifirooz, K. Fogel, P. Lauro, K. Cheng, J. Ott, M. Gaynes, D. Sadana
{"title":"Advanced flexible CMOS integrated circuits on plastic enabled by controlled spalling technology","authors":"D. Shahrjerdi, S. Bedell, A. Khakifirooz, K. Fogel, P. Lauro, K. Cheng, J. Ott, M. Gaynes, D. Sadana","doi":"10.1109/IEDM.2012.6478981","DOIUrl":null,"url":null,"abstract":"We present, for the first time, mechanically-flexible advanced-node CMOS circuits, including SRAM and ring oscillators, with gate lengths <;30 nm and contacted gate pitch of 100 nm. Our novel layer transfer technique called “controlled spalling” is employed as an incredibly simple, low-cost, and manufacturable approach to separate the finished CMOS circuits from the host silicon substrate. The overall performance of the flexible devices and circuits are carefully examined, demonstrating functional SRAM cells down to VDD=0.6V and ring oscillators with record stage delay of ~16ps, the best reported to date for a flexible circuit.","PeriodicalId":6376,"journal":{"name":"2012 International Electron Devices Meeting","volume":"17 1","pages":"5.1.1-5.1.4"},"PeriodicalIF":0.0000,"publicationDate":"2012-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"25","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 International Electron Devices Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.2012.6478981","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 25

Abstract

We present, for the first time, mechanically-flexible advanced-node CMOS circuits, including SRAM and ring oscillators, with gate lengths <;30 nm and contacted gate pitch of 100 nm. Our novel layer transfer technique called “controlled spalling” is employed as an incredibly simple, low-cost, and manufacturable approach to separate the finished CMOS circuits from the host silicon substrate. The overall performance of the flexible devices and circuits are carefully examined, demonstrating functional SRAM cells down to VDD=0.6V and ring oscillators with record stage delay of ~16ps, the best reported to date for a flexible circuit.
先进的柔性CMOS集成电路在塑料上实现控制剥落技术
我们首次提出了机械柔性的先进节点CMOS电路,包括SRAM和环形振荡器,其栅极长度< 30 nm,接触栅极间距为100 nm。我们的新层转移技术称为“控制剥落”,是一种非常简单、低成本和可制造的方法,可以将成品CMOS电路与主硅衬底分离。仔细检查了柔性器件和电路的整体性能,展示了功能SRAM单元低至VDD=0.6V和环形振荡器,其记录级延迟为~16ps,这是迄今为止柔性电路中最好的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信