Visualization and Modeling of Microstructural Evolution in SAC305 BGA Joints during Extreme High Temperature Aging

Abstract

Solder joints provide mechanical support, electrical and thermal interconnection between packaging levels in microelectronics assembly systems. Proper functioning of these interconnections and the reliability of the electronic packages depend largely on the mechanical properties of the solder joints. Lead free solders are common as interconnects in electronic packaging due to their relatively high melting point, attractive mechanical properties, thermal cycling reliability, and environment friendly chemical properties. However, environmental conditions, such as, operating temperature, aging temperature, and aging time significantly affect these properties due to the microstructural evolution of the solder that occurs during aging. Moreover, electronic devices, sometimes experience harsh environment applications including well drilling, geothermal energy, automotive power electronics, and aerospace engines, where solders are exposed to very high temperatures from T = 125-200 °C. Mechanical properties as well as microstructural study of lead free solders at elevated temperatures are limited in literature. Previous investigations on the microstructural evolution mainly emphasized on aging at temperatures up to 125 °C. In addition, those studies were limited on investigating the coarsening of Ag3Sn IMC particles within the beta-Sn matrix.In this work, the microstructural evolution of SAC305 (96.5Sn-3.0Ag-0.5Cu) BGA joints were investigated for different aging conditions utilizing Scanning Electron Microscopy (SEM). In particular, our approach has been to monitor aging induced microstructural changes occurring within fixed regions in selected lead free solder joints, and to create time-lapse imagery of the microstructure evolution. Aging was performed at T = 150 °C for several durations up to 20 days, and the topography of the microstructure of a fixed region was captured using the SEM system. This process generated several images of the microstructure as the aging progressed. We have also explored the Mechanical behavior, and aging effects of SAC305 solder joints at extreme high testing temperatures of T = 150 °C using the method of nanoindentation. To study the aging effects, solder joints were preconditioned for 0, 1, 5, 10, and 30 days at T = 125 °C in a box oven. Nanoindentation testing was then performed on the aged specimens at a test temperature of T = 150 °C to extract the elastic modulus, hardness, and creep performance of the aged material.As expected, the analysis of the evolving SAC305 BGA microstructure showed a significant amount of diffusion of silver and copper in the beta-tin matrix during aging. In addition, the growth of the copper-tin layer at the solder joint and copper pad interface at the PCB side has been visualized, and then measured as a function of aging time and temperature. Quantitative analysis of the evolving microstructure showed that the particles coalesced during aging leading to a decrease in the total number of particles. This caused an increase in the average diameter of the particles with aging time, and a double exponential empirical model was used to fit the observed data. The nanoindentation test results also showed a huge degradation in the mechanical properties with the aging time. The time dependent evolution of the microstructure was compared to the degradation in the modulus during aging, and good correlation was observed.