Design of Experiments for Board-Level Solder Joint Reliability of PBGA Package Under Various Manufacturing and Multiple Environmental Loading Conditions

Haiyu Qi, M. Osterman, M. Pecht
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引用次数: 24

Abstract

A design of experiments was conducted to determine the reliability of plastic ball grid array packages under various manufacturing and multiple environmental loading conditions. Parameters included conformal coating methods, underfill, solder mask defined, and non-solder mask defined pads. Board-level temperature cycling, vibration, and combined temperature cycling and vibration testing were performed to quantify the reliability and identify preferred design parameters. Through the main effects and interaction analysis, test results show underfill is the key parameter related to the solder joint reliability improvement. Conformal coat method and printed circuit board pad design are not main effects on solder joint reliability. No interactive relationship exists among these three factors under temperature cycling loading, but some interactive relationship between printed circuit board pad type and the conformal coating method exists under vibration and combined loading conditions.
PBGA封装板级焊点可靠性实验设计
为了确定塑料球栅阵列封装在不同制造和多种环境载荷条件下的可靠性,进行了实验设计。参数包括保形涂层方法、下填充、定义的阻焊板和定义的非阻焊板。通过板级温度循环、振动以及温度循环和振动组合测试来量化可靠性并确定优选的设计参数。通过主效应和交互作用分析,试验结果表明,下填量是关系到焊点可靠性提高的关键参数。共形涂层方法和印刷电路板衬垫设计不是影响焊点可靠性的主要因素。在温度循环加载条件下,这三个因素之间不存在交互关系,但在振动和复合加载条件下,印刷电路板衬垫类型与共形涂层方式之间存在一定的交互关系。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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