Study on flip chip assembly of high density micro-LED array

Chao-Chyun An, Ming-Hsien Wu, Yu-wei Huang, Tai-Hong Chen, C. Chao, W. Yeh
{"title":"Study on flip chip assembly of high density micro-LED array","authors":"Chao-Chyun An, Ming-Hsien Wu, Yu-wei Huang, Tai-Hong Chen, C. Chao, W. Yeh","doi":"10.1109/IMPACT.2011.6117235","DOIUrl":null,"url":null,"abstract":"Flip chip assembly technology is an attractive solution for high I/O density and fine-pitch microelectronics packaging. Recently, high efficient GaN-based light-emitting diodes (LEDs) have undergone a rapid development and flip chip bonding has been widely applied to fabricate high-brightness GaN micro-LED arrays [1]. The flip chip GaN LED has some advantages over the traditional top-emission LED, including improved current spreading, higher light extraction efficiency, better thermal dissipation capability and the potential of further optical component integration [2, 3]. With the advantages of flip chip assembly, micro-LED (μLED) arrays with high I/O density can be performed with improved luminous efficiency than conventional p-side-up micro-LED arrays and are suitable for many potential applications, such as micro-displays, bio-photonics and visible light communications (VLC), etc. In particular, μLED array based selif-emissive micro-display has the promising to achieve high brightness and contrast, reliability, long-life and compactness, which conventional micro-displays like LCD, OLED, etc, cannot compete with. In this study, GaN micro-LED array device with flip chip assembly package process was presented. The bonding quality of flip chip high density micro-LED array is tested by daisy chain test. The p-n junction tests of the devices are measured for electrical characteristics. The illumination condition of each micro-diode pixel was examined under a forward bias. Failure mode analysis was performed using cross sectioning and scanning electron microscopy (SEM). Finally, the fully packaged micro-LED array device is demonstrated as a prototype of dice projector system.","PeriodicalId":6360,"journal":{"name":"2011 6th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT)","volume":"27 1","pages":"336-338"},"PeriodicalIF":0.0000,"publicationDate":"2011-12-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"14","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 6th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMPACT.2011.6117235","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 14

Abstract

Flip chip assembly technology is an attractive solution for high I/O density and fine-pitch microelectronics packaging. Recently, high efficient GaN-based light-emitting diodes (LEDs) have undergone a rapid development and flip chip bonding has been widely applied to fabricate high-brightness GaN micro-LED arrays [1]. The flip chip GaN LED has some advantages over the traditional top-emission LED, including improved current spreading, higher light extraction efficiency, better thermal dissipation capability and the potential of further optical component integration [2, 3]. With the advantages of flip chip assembly, micro-LED (μLED) arrays with high I/O density can be performed with improved luminous efficiency than conventional p-side-up micro-LED arrays and are suitable for many potential applications, such as micro-displays, bio-photonics and visible light communications (VLC), etc. In particular, μLED array based selif-emissive micro-display has the promising to achieve high brightness and contrast, reliability, long-life and compactness, which conventional micro-displays like LCD, OLED, etc, cannot compete with. In this study, GaN micro-LED array device with flip chip assembly package process was presented. The bonding quality of flip chip high density micro-LED array is tested by daisy chain test. The p-n junction tests of the devices are measured for electrical characteristics. The illumination condition of each micro-diode pixel was examined under a forward bias. Failure mode analysis was performed using cross sectioning and scanning electron microscopy (SEM). Finally, the fully packaged micro-LED array device is demonstrated as a prototype of dice projector system.
高密度微型led阵列倒装芯片组装研究
倒装芯片组装技术是高I/O密度和细间距微电子封装的一个有吸引力的解决方案。近年来,高效氮化镓基发光二极管(led)得到了快速发展,倒装键合技术被广泛应用于制造高亮度氮化镓微led阵列[1]。倒装芯片GaN LED与传统的顶发射LED相比具有一些优势,包括改善的电流扩展,更高的光提取效率,更好的散热能力以及进一步光学元件集成的潜力[2,3]。凭借倒装芯片的优点,具有高I/O密度的微led (μLED)阵列比传统的正面朝上的微led阵列具有更高的发光效率,适用于微显示、生物光子学和可见光通信(VLC)等许多潜在的应用。特别是基于μLED阵列的自发射微显示器具有LCD、OLED等传统微显示器无法比拟的高亮度、高对比度、高可靠性、长寿命和紧凑性等优点。本文提出了一种采用倒装封装工艺的GaN微led阵列器件。采用菊花链试验对倒装高密度微型led阵列的键合质量进行了测试。对器件的pn结试验进行电特性测量。在正向偏压下,检测了每个微二极管像素的照明情况。失效模式分析采用横切和扫描电子显微镜(SEM)。最后,将全封装的微led阵列器件作为骰子投影系统的原型进行了演示。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信