A 2-tier Embedded 3D Capacitor with High Aspect Ratio TSV

K. Chui, I-Ting Wang, Faxing Che, Zhixian Chen, Xiangy-Yu Wang, W. Loh, Qin Ren, L. Ji, Yao Zhu
{"title":"A 2-tier Embedded 3D Capacitor with High Aspect Ratio TSV","authors":"K. Chui, I-Ting Wang, Faxing Che, Zhixian Chen, Xiangy-Yu Wang, W. Loh, Qin Ren, L. Ji, Yao Zhu","doi":"10.1109/ectc32862.2020.00101","DOIUrl":null,"url":null,"abstract":"This paper describes the concept and demonstration of a 2-tier MIMIM capacitor that can be placed around a TSV. By fabricating the metal-insulator-metal-insulator-metal (MIMIM) capacitor around the TSV, more than 30× increase in capacitance over a planar capacitor occupying the same planar area can be achieved. High-k dielectric, HfO2 is deposited using Atomic Layer Deposition (ALD) process for good and uniform coverage required in TSV. By employing an insulator with large dielectric constant (with reference to SiO2), capacitance can be increased significantly. Thermomechanical simulations have verified that there is little impact to the stress induced in the Si and Keep-Out-Zone (KOZ) of TSVs around which the MIMIM capacitor is embedded.","PeriodicalId":6722,"journal":{"name":"2020 IEEE 70th Electronic Components and Technology Conference (ECTC)","volume":"15 1","pages":"611-616"},"PeriodicalIF":0.0000,"publicationDate":"2020-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE 70th Electronic Components and Technology Conference (ECTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ectc32862.2020.00101","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

This paper describes the concept and demonstration of a 2-tier MIMIM capacitor that can be placed around a TSV. By fabricating the metal-insulator-metal-insulator-metal (MIMIM) capacitor around the TSV, more than 30× increase in capacitance over a planar capacitor occupying the same planar area can be achieved. High-k dielectric, HfO2 is deposited using Atomic Layer Deposition (ALD) process for good and uniform coverage required in TSV. By employing an insulator with large dielectric constant (with reference to SiO2), capacitance can be increased significantly. Thermomechanical simulations have verified that there is little impact to the stress induced in the Si and Keep-Out-Zone (KOZ) of TSVs around which the MIMIM capacitor is embedded.
具有高宽高比TSV的2层嵌入式3D电容器
本文介绍了一种可以放置在TSV周围的2层mimm电容器的概念和演示。通过在TSV周围制造金属-绝缘体-金属-绝缘体-金属(mimm)电容器,可以实现比占用相同平面面积的平面电容器增加30倍以上的电容。采用原子层沉积(ALD)工艺沉积高k介电介质HfO2,以获得TSV所需的良好均匀覆盖。采用介电常数较大的绝缘体(相对于SiO2),可以显著提高电容。热力学模拟证实,在嵌入mimm电容器的tsv的Si和keep - out区(KOZ)中诱导的应力几乎没有影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信