InGaAs/InP SPAD with improved structure for sharp timing response

A. Tosi, F. Acerbi, M. Anti, F. Zappa
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Abstract

We designed and fabricated a 25 μm active area diameter In0.53Ga0.47As/InP Single-Photon Avalanche Diode (SPAD) with improved layer structure and diffusion geometry in order to achieve good detection efficiency (~30% at 1550 nm), low afterpulsing (gate repetition frequency higher than 1 MHz) and very good timing performance (the timing response has a Full-Width at Half Maximum of about 57 ps at 9 V of excess bias and a fast tail with a time constant of about 30 ps).
具有改进结构的InGaAs/InP SPAD,具有锐利的时序响应
我们设计和制造一个25μm有效面积直径In0.53Ga0.47As /输入单光子雪崩二极管(SPAD)与改进的层状结构和几何扩散以达到良好的探测效率在1550 nm(~ 30%),低寄生脉冲(门重复频率高于1 MHz)和非常好的时机性能(响应时间有宽屏一半最多约57 ps 9 V过剩的偏见和快速尾巴的时间常数约30 ps)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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