Supercritical fluid processes for semiconductor device fabrication

L. Rothman, R. J. Robey, M. K. Ali, D. Mount
{"title":"Supercritical fluid processes for semiconductor device fabrication","authors":"L. Rothman, R. J. Robey, M. K. Ali, D. Mount","doi":"10.1109/ASMC.2002.1001636","DOIUrl":null,"url":null,"abstract":"As semiconductor device dimensions approach the nanoscale, it will become increasing difficult to use aqueous-based cleaning processes due to high surface tension and capillary forces. Supercritical fluids provide the enabling capabilities for overcoming these process barriers. This paper will discuss the use of supercritical carbon dioxide and co-solvents for photoresist stripping and wafer cleaning.","PeriodicalId":64779,"journal":{"name":"半导体技术","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"半导体技术","FirstCategoryId":"1087","ListUrlMain":"https://doi.org/10.1109/ASMC.2002.1001636","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 11

Abstract

As semiconductor device dimensions approach the nanoscale, it will become increasing difficult to use aqueous-based cleaning processes due to high surface tension and capillary forces. Supercritical fluids provide the enabling capabilities for overcoming these process barriers. This paper will discuss the use of supercritical carbon dioxide and co-solvents for photoresist stripping and wafer cleaning.
半导体器件制造的超临界流体工艺
随着半导体器件尺寸接近纳米级,由于高表面张力和毛细力,使用水基清洗工艺将变得越来越困难。超临界流体为克服这些工艺障碍提供了有利条件。本文将讨论超临界二氧化碳和助溶剂在光刻胶剥离和晶圆清洗中的应用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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