Manvi Sharma, M. Rai, R. Khanna
{"title":"Dielectric surface roughness scattering induced crosstalk performance of coupled MCB interconnects","authors":"Manvi Sharma, M. Rai, R. Khanna","doi":"10.1016/J.MEJO.2021.105084","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":18617,"journal":{"name":"Microelectron. J.","volume":"83 1","pages":"105084"},"PeriodicalIF":0.0000,"publicationDate":"2021-05-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectron. J.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1016/J.MEJO.2021.105084","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9