Voltage-induced switching of nanoscale magnetic tunnel junctions

J. G. Alzate, P. Amiri, P. Upadhyaya, S. Cherepov, Jian Zhu, Mark Lewis, Richard Dorrance, J. Katine, Jürgen Langer, Kosmas Galatsis, D. Markovic, Ilya Krivorotov, Kang L. Wang
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引用次数: 70

Abstract

We demonstrate voltage-induced (non-STT) switching of nanoscale, high resistance voltage-controlled magnetic tunnel junctions (VMTJs) with pulses down to 10 ns. We show ~10x reduction in switching energies (compared to STT) with leakage currents <; 105 A/cm2. Switching dynamics, from quasi-static to the nanosecond regime, are studied in detail. Finally, a strategy for eliminating the need for external magnetic-fields, where switching is performed by set/reset voltages of different amplitudes but same polarity, is proposed and verified experimentally.
纳米级磁隧道结的电压感应开关
我们演示了电压感应(非stt)开关的纳米级,高电阻电压控制磁隧道结(VMTJs)的脉冲低至10 ns。我们发现,当泄漏电流<;时,开关能量(与STT相比)降低了~10倍;105 /平方厘米。详细研究了从准静态到纳秒状态的切换动力学。最后,提出了一种消除外部磁场需求的策略,其中开关由不同幅度但相同极性的设置/复位电压进行,并通过实验验证。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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