The humidity and thermal characteristics of die-attach (DA) and its impact on the package reliability

C. Ning, Xiaosong Ma, Jiang Haihua
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Abstract

In this paper, a humidity absorption test experiment is carried out under the temperature 20degC, 40degC and 60degC respectively and the environmental humidity was changed in different modes in each case. The experimental sample is from material of DA, and it is 14.5times5.5times0.37 mm3 in size, and 94.4 mg in weight. The experiment data are collected to gain the saturated moisture. The moisture diffusion coefficient (D) of the sample can be calculated by fitting the line of data curve and calculating the slope of the line. The constants (QD and D0) which are in the Arrhenius formula are worded out by using the D [1]. In order to analyze the failure model in the interface between DA and die pad, a new type of system-in-package (SiP) is modeled. The simulation environments are set as the conditions of stored in the room temperature and processed in the SMT assembly production line. The analysis aim is to calculate the humidity distribution and the hygroscopic and thermal stress in these conditions. The results of FEM analysis shows that the max hygromechanical and thermo-mechanical stress appear in the corner of the interface between the Die and the DA, and the corner may be the risk location. The delamination may occur in this place. So it is necessary to analysis the reliability of the interface between the DA and others materials.
热湿特性及其对封装可靠性的影响
本文分别在温度20℃、40℃和60℃下进行吸湿测试实验,并在每种情况下以不同模式改变环境湿度。实验样品为DA材料,尺寸为14.5 × 5.5 × 0.37 mm3,重量为94.4 mg。采集实验数据,获得饱和水分。通过拟合数据曲线的直线并计算直线的斜率,可以计算样品的水分扩散系数D。阿伦尼乌斯公式中的常数(QD和D0)用D[1]表示出来。为了分析DA与模垫接口的失效模型,对一种新型的系统级封装(SiP)进行了建模。模拟环境设定为室温下存储和在SMT组装生产线上加工的条件。分析的目的是计算在这些条件下的湿度分布以及吸湿和热应力。有限元分析结果表明,最大湿机械应力和热机械应力出现在凹模与凹模交界面转角处,转角处可能是危险部位。分层可能发生在这个地方。因此,有必要对DA与其他材料之间的界面可靠性进行分析。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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