{"title":"Test Technology TC Newsletter","authors":"T. Theocharides","doi":"10.1109/MDAT.2014.2308364","DOIUrl":null,"url":null,"abstract":"The TTTC website has been updated to include several more features and information for its visitors! To find out more, please visit the website at http://www.ieee-tttc.org/ .","PeriodicalId":50392,"journal":{"name":"IEEE Design & Test of Computers","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2013-01-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Design & Test of Computers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MDAT.2014.2308364","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The TTTC website has been updated to include several more features and information for its visitors! To find out more, please visit the website at http://www.ieee-tttc.org/ .