Adar A. Kalir;Sin Kit Lo;Gavan Goldberg;Irena Zingerman-Koladko;Aviv Ohana;Yossi Revah;Tsvi Ben Chimol;Gavriel Honig
{"title":"Leveraging Machine Learning for Capacity and Cost on a Complex Toolset: A Case Study","authors":"Adar A. Kalir;Sin Kit Lo;Gavan Goldberg;Irena Zingerman-Koladko;Aviv Ohana;Yossi Revah;Tsvi Ben Chimol;Gavriel Honig","doi":"10.1109/TSM.2023.3314431","DOIUrl":null,"url":null,"abstract":"In this case study, we introduce two ML techniques, Long Short-Term Memory (LSTM) and an optimized Random Forest (RF), to address challenges related to capacity and cost, by addressing problems of unscheduled downtime and Process Time (PT) variation in the case of a complex chamber processing tool. We show that by using these ML techniques, traditional methods of Predictive Maintenance (PdM) and PT analysis can be enhanced with new insights and lead to significant productivity improvements. We demonstrate that, with these methods, by detecting states and attributes of the tool, trends in the tool’s behavior can be more effectively identified to reduce its unscheduled downtime and improve its run-rate, thereby resulting in significant capacity and cost improvements. This is achieved by reducing the variability of availability; extending the Mean Time Between Failures (MTBF); and removing variability in PT between lots and chambers.","PeriodicalId":451,"journal":{"name":"IEEE Transactions on Semiconductor Manufacturing","volume":"36 4","pages":"611-618"},"PeriodicalIF":2.3000,"publicationDate":"2023-09-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Semiconductor Manufacturing","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10247612/","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
In this case study, we introduce two ML techniques, Long Short-Term Memory (LSTM) and an optimized Random Forest (RF), to address challenges related to capacity and cost, by addressing problems of unscheduled downtime and Process Time (PT) variation in the case of a complex chamber processing tool. We show that by using these ML techniques, traditional methods of Predictive Maintenance (PdM) and PT analysis can be enhanced with new insights and lead to significant productivity improvements. We demonstrate that, with these methods, by detecting states and attributes of the tool, trends in the tool’s behavior can be more effectively identified to reduce its unscheduled downtime and improve its run-rate, thereby resulting in significant capacity and cost improvements. This is achieved by reducing the variability of availability; extending the Mean Time Between Failures (MTBF); and removing variability in PT between lots and chambers.
期刊介绍:
The IEEE Transactions on Semiconductor Manufacturing addresses the challenging problems of manufacturing complex microelectronic components, especially very large scale integrated circuits (VLSI). Manufacturing these products requires precision micropatterning, precise control of materials properties, ultraclean work environments, and complex interactions of chemical, physical, electrical and mechanical processes.