Uncertainty Quantification of Signal Integrity Analysis for Neuromorphic Chips

Abstract

A dimensionality reduction based neural network framework is introduced for uncertainty quantification of time-domain response based on system uncertain design parameters for neuromorphic chips. The proposed method firstly makes use of the singular value decomposition (SVD) method to find the basis functions and corresponding coefficients of time-domain response, of which coefficients are used as a lower dimensional target outputs in neural network model compared with time sampling points prediction. This newly proposed method then develops an integrated neural network structure to simultaneously find the mean and variance of target coefficients with a combined definition of loss function, which can be utilized together with basis functions to construct the prediction interval of time-domain response. A memrisor-based crossbar array is applied in this work to verify the performance of the proposed method with the comparison of Monte Carlo method.