V. Champac, Julio Vazquez Hernandez, S. Barcelo, Roberto Gómez, C. Hawkins, J. Segura
{"title":"Testing of Stuck-Open Faults in Nanometer Technologies","authors":"V. Champac, Julio Vazquez Hernandez, S. Barcelo, Roberto Gómez, C. Hawkins, J. Segura","doi":"10.1109/MDT.2012.2205609","DOIUrl":null,"url":null,"abstract":"Failure analysis and fault modeling of integrated circuits have always been fields that require continuous revision and update as manufacturing processes evolve. This paper discusses the new face of the well-known transistor stuck-open fault model in modern nanometer technologies and proposes new detection methods that improve the robustness of tests.","PeriodicalId":50392,"journal":{"name":"IEEE Design & Test of Computers","volume":"29 1","pages":"80-91"},"PeriodicalIF":0.0000,"publicationDate":"2012-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1109/MDT.2012.2205609","citationCount":"14","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Design & Test of Computers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MDT.2012.2205609","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 14
Abstract
Failure analysis and fault modeling of integrated circuits have always been fields that require continuous revision and update as manufacturing processes evolve. This paper discusses the new face of the well-known transistor stuck-open fault model in modern nanometer technologies and proposes new detection methods that improve the robustness of tests.
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