A look at silicon debug and diagnosis [From the EIC]

Abstract

The Editor-in-Cheif is pleased to present this July-August issue, which brings you a combination of articles that cover a rich set of academic and industrial work addressing state-of-the-art issues of design, verification, and test of different IC-based systems represented at different levels of abstraction. The figure of merit for the different approaches varies, depending on the specific case, but are generally variations of cost, performance, quality, yield, and feasibility. An overview of each of the technical articles and features is presented.